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Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.
G. Cardoso Medeiros
E. Brum
Leticia Bolzani Poehls
Thiago Copetti
Tiago R. Balen
Published in:
LATS (2018)
Keyphrases
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dynamic behavior
temporal behavior
fault diagnosis
artificial intelligence
dynamic environments
human behavior
fault detection
personality traits
knowledge base
dynamically changing