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Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.

G. Cardoso MedeirosE. BrumLeticia Bolzani PoehlsThiago CopettiTiago R. Balen
Published in: LATS (2018)
Keyphrases
  • dynamic behavior
  • temporal behavior
  • fault diagnosis
  • artificial intelligence
  • dynamic environments
  • human behavior
  • fault detection
  • personality traits
  • knowledge base
  • dynamically changing