Leticia Bolzani Poehls

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 14

Top Topics

Wireless Sensor

Fully Automated

Top Venues

J. Electron. Test.

Publications

Rebecca Pelke, Felix Staudigl, Niklas Thomas, Nils Bosbach, Mohammed Hossein, José Cubero-Cascante, Leticia Bolzani Poehls, Rainer Leupers, Jan Moritz Joseph
A Fully Automated Platform for Evaluating ReRAM Crossbars. CoRR (2024)
Felix Staudigl, Thorben Fetz, Rebecca Pelke, Dominik Sisejkovic, Jan Moritz Joseph, Leticia Bolzani Poehls, Rainer Leupers
Fault Injection in Native Logic-in-Memory Computation on Neuromorphic Hardware. CoRR (2023)
G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. ETS (2021)
Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. 36 (2) (2020)
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS (2020)
Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS (2019)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35 (2) (2019)
Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS (2019)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS (2018)
George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls
A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. LATS (2018)
F. Tubiello, Leticia Bolzani Poehls, Thais Webber, César Augusto Missio Marcon, Fabian Vargas
A path energy control technique for energy efficiency on wireless sensor networks. LASCAS (2018)
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. 32 (3) (2016)
Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
Gate-level modelling of NBTI-induced delays under process variations. LATS (2016)
Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. J. Electron. Test. 32 (3) (2016)
Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas
On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment. EMC Compo (2015)