Sergei Kostin

Publication Activity (10 Years)

Years Active: 2007-2018
Publications (10 Years): 8

Top Topics

Mechanical Properties

Random Selection

Top Venues

J. Electron. Test.

Publications

Lembit Jurimagi, Raimund Ubar, Maksim Jenihhin, Jaan Raik, Sergei Devadze, Sergei Kostin
Hierarchical Timing-Critical Paths Analysis in Sequential Circuits. PATMOS (2018)
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi
Fast identification of true critical paths in sequential circuits. Microelectron. Reliab. 81 (2018)
Jaak Kousaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik
Parallel Critical Path Tracing Fault Simulation in Sequential Circuits. MIXDES (2018)
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik
A scalable technique to identify true critical paths in sequential circuits. DDECS (2017)
Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electron. Test. 32 (3) (2016)
Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik
A novel random approach to diagnostic test generation. NORCAS (2016)
Sergei Kostin, Elmet Orasson, Raimund Ubar
A tool set for teaching design-for-testability of digital circuits. EWME (2016)
Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
Gate-level modelling of NBTI-induced delays under process variations. LATS (2016)
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls
SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic. DDECS (2015)
N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG. LATS (2015)
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti
Hierarchical identification of NBTI-critical gates in nanoscale logic. LATW (2014)
Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls
Identifying NBTI-Critical Paths in Nanoscale Logic. DSD (2013)
Raimund Ubar, Sergei Kostin, Jaan Raik
Synthesis of multiple fault oriented test groups from single fault test sets. DTIS (2013)
Ivo Fridolin, Deniss Karai, Sergei Kostin, Raimund Ubar
Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During Online Optical Dialysis Monitoring. IEEE Trans. Biomed. Eng. 60 (5) (2013)
Raimund Ubar, Sergei Kostin, Jaan Raik
Multiple stuck-at-fault detection theorem. DDECS (2012)
Raimund Ubar, Sergei Kostin, Jaan Raik
How to Prove that a Circuit is Fault-Free? DSD (2012)
Raimund Ubar, Sergei Kostin, Jaan Raik
About robustness of test patterns regarding multiple faults. LATW (2012)
Sergei Kostin, Raimund Ubar, Jaan Raik
Defect-oriented module-level fault diagnosis in digital circuits. DDECS (2011)
Raimund Ubar, Sergei Kostin, Jaan Raik
Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems. DSD (2009)
Raimund Ubar, Artur Jutman, Jaan Raik, Sergei Kostin, Heinz-Dietrich Wuttke
Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems. MSE (2009)
Raimund Ubar, Sergei Kostin, Jaan Raik
Investigations of the diagnosibility of digital networks with BIST. LATW (2009)
Raimund Ubar, Sergei Kostin, Jaan Raik
Embedded fault diagnosis in digital systems with BIST. Microprocess. Microsystems 32 (5-6) (2008)
Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evartson, Harri Lensen
Fault Diagnosis in Integrated Circuits with BIST. DSD (2007)