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Fast identification of true critical paths in sequential circuits.

Raimund UbarSergei KostinMaksim JenihhinJaan RaikLembit Jürimägi
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • shortest path
  • database
  • automatic identification
  • feature selection
  • decision making
  • artificial neural networks
  • high speed
  • identification rate
  • delay insensitive
  • quantum computing
  • previously identified