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C. Aquistapace
Publication Activity (10 Years)
Years Active: 2019-2020
Publications (10 Years): 2
Top Topics
Analog Vlsi
Defect Detection
Comparative Study
Chip Design
Top Venues
LATS
J. Electron. Test.
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Publications
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Thiago Copetti
,
Tiago R. Balen
,
E. Brum
,
C. Aquistapace
,
Leticia Bolzani Poehls
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.
J. Electron. Test.
36 (2) (2020)
Thiago Santos Copetti
,
Tiago R. Balen
,
E. Brum
,
C. Aquistapace
,
Leticia Bolzani Poehls
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects.
LATS
(2019)