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Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.
Thiago Copetti
Tiago R. Balen
E. Brum
C. Aquistapace
Leticia Bolzani Poehls
Published in:
J. Electron. Test. (2020)
Keyphrases
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power consumption
low power
high speed
power management
artificial intelligence
information technology
chip design
factors that influence
circuit design
defect detection
power dissipation
high impact
ultra low power
analog vlsi
power supply
steady state
multiscale