E. Brum

Publication Activity (10 Years)

Years Active: 2018-2021
Publications (10 Years): 6

Top Topics

Comparative Study

Manufacturing Process

Fault Detection

Top Venues

J. Electron. Test.

Publications

Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. J. Electron. Test. 37 (4) (2021)
E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani
Evaluating the Impact of Process Variation on RRAMs. LATS (2021)
Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. J. Electron. Test. 36 (2) (2020)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. J. Electron. Test. 35 (2) (2019)
Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS (2019)
G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. LATS (2018)