A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects.
Thiago Santos CopettiTiago R. BalenE. BrumC. AquistapaceLeticia Bolzani PoehlsPublished in: LATS (2019)
Keyphrases
- defect detection
- power consumption
- defect classification
- power supply
- high speed
- comparative study
- analog vlsi
- low cost
- circuit design
- delay insensitive
- low power
- hd video
- low voltage
- chip design
- data sets
- artificial neural networks
- image processing
- cmos technology
- learning algorithm
- data mining
- automated visual inspection
- cmos image sensor
- databases