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Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.

G. Cardoso MedeirosE. BrumLeticia Bolzani PoehlsThiago CopettiTiago R. Balen
Published in: J. Electron. Test. (2019)
Keyphrases
  • dynamic environments
  • fault diagnosis
  • data mining
  • fault detection
  • databases
  • machine learning
  • artificial intelligence
  • e learning