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Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.
G. Cardoso Medeiros
E. Brum
Leticia Bolzani Poehls
Thiago Copetti
Tiago R. Balen
Published in:
J. Electron. Test. (2019)
Keyphrases
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dynamic environments
fault diagnosis
data mining
fault detection
databases
machine learning
artificial intelligence
e learning