HIGH IMPACT
Experts
- Loet Leydesdorff
- Lutz Bornmann
- Vincent Larivière
- Mike Thelwall
- Henk F. Moed
- Wolfgang Glänzel
- Ronald Rousseau
- Giovanni Abramo
- Kalle Lyytinen
- Dimo Brockhoff
- Ludo Waltman
- Yves Gingras
- Leo Egghe
- Herbert Van de Sompel
- Ruth Fairclough
- Ciriaco Andrea D'Angelo
- Asen Asenov
- Matthias Jarke
- Michael L. Nelson
- Chengzhi Zhang
- Filippo Radicchi
- Hakim Lounis
- Michele C. Weigle
- Filippo Menczer
- Ahmed E. Hassan
- Cassidy R. Sugimoto
- Hussam Amrouch
- Amir Salman Avestimehr
- Houari A. Sahraoui
- Mat Kelly
- Ben Kaczer
- Jonathan Gratch
- Juan Miguel Campanario
- Salah-Eddine Elayoubi
- Min-Jea Tahk
- Dorothy E. Leidner
- Michiel van Genuchten
- Naghmeh Karimi
- Ali Ouni
Venues
- CoRR
- Scientometrics
- Remote. Sens.
- IEEE Access
- Sensors
- Microelectron. Reliab.
- HICSS
- ICIS
- J. Informetrics
- AMCIS
- J. Assoc. Inf. Sci. Technol.
- IGARSS
- Manag. Sci.
- OFC
- IRPS
- PACIS
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- Commun. ACM
- ISSI
- NeuroImage
- PLoS Comput. Biol.
- AMIA
- GLOBECOM
- ICC
- Inf. Manag.
- ECIS
- Comput. Hum. Behav.
- CogSci
- Eur. J. Oper. Res.
- CHI
- MediaEval
- ESSDERC
- CHI Extended Abstracts
- J. Chem. Inf. Model.
- SIGCSE
- Decis. Support Syst.
- Quant. Sci. Stud.
- EUSIPCO
- Learn. Publ.
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