HIGH IMPACT
Experts
- Loet Leydesdorff
- Lutz Bornmann
- Vincent Larivière
- Mike Thelwall
- Wolfgang Glänzel
- Henk F. Moed
- Ronald Rousseau
- Giovanni Abramo
- Kalle Lyytinen
- Dimo Brockhoff
- Leo Egghe
- Ludo Waltman
- Herbert Van de Sompel
- Yves Gingras
- Asen Asenov
- Ruth Fairclough
- Filippo Radicchi
- Matthias Jarke
- Ciriaco Andrea D'Angelo
- Chengzhi Zhang
- Michael L. Nelson
- Michele C. Weigle
- Mat Kelly
- Filippo Menczer
- Cassidy R. Sugimoto
- Hussam Amrouch
- Hakim Lounis
- Ahmed E. Hassan
- Amir Salman Avestimehr
- Houari A. Sahraoui
- David Lo
- Juan Miguel Campanario
- Martin Omaña
- Jörg Henkel
- Johan Bollen
- Emad Shihab
- David W. Bates
- Ying Ding
- Javier Ruiz-Castillo
Venues
- CoRR
- Scientometrics
- Remote. Sens.
- IEEE Access
- Microelectron. Reliab.
- Sensors
- ICIS
- AMCIS
- HICSS
- J. Informetrics
- J. Assoc. Inf. Sci. Technol.
- IGARSS
- Manag. Sci.
- OFC
- IRPS
- PACIS
- WSC
- ISSI
- Commun. ACM
- PLoS Comput. Biol.
- NeuroImage
- GLOBECOM
- AMIA
- ICC
- ECIS
- Inf. Manag.
- Comput. Hum. Behav.
- CogSci
- Eur. J. Oper. Res.
- CHI Extended Abstracts
- MediaEval
- ESSDERC
- CHI
- Decis. Support Syst.
- J. Chem. Inf. Model.
- SIGCSE
- ISGT Europe
- Computer
- Quant. Sci. Stud.
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