Asen Asenov

Publication Activity (10 Years)

Years Active: 1994-2023
Publications (10 Years): 17

Top Topics

Analytical Models

Top Venues

Microelectron. Reliab.

Publications

Preslav Aleksandrov, Ali Rezaei, Nikolas Xeni, Tapas Dutta, Asen Asenov, Vihar P. Georgiev
Fully Convolutional Generative Machine Learning Method for Accelerating Non-Equilibrium Greens Function Simulations. CoRR (2023)
Rongmei Chen, Lin Chen, Jie Liang, Yuanqing Cheng, Souhir Elloumi, Jaehyun Lee, Kangwei Xu, Vihar P. Georgiev, Kai Ni, Peter Debacker, Asen Asenov, Aida Todri-Sanial
Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part II: CNT Interconnect Optimization. IEEE Trans. Very Large Scale Integr. Syst. 30 (4) (2022)
Rongmei Chen, Lin Chen, Jie Liang, Yuanqing Cheng, Souhir Elloumi, Jaehyun Lee, Kangwei Xu, Vihar P. Georgiev, Kai Ni, Peter Debacker, Asen Asenov, Aida Todri-Sanial
Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part I: CNFET Transistor Optimization. IEEE Trans. Very Large Scale Integr. Syst. 30 (4) (2022)
Tapas Dutta, Cristina Medina-Bailon, Ali Rezaei, Daniel Nagy, Fikru Adamu-Lema, Nikolas Xeni, Yassine Abourrig, Naveen Kumar, Vihar P. Georgiev, Asen Asenov
TCAD Simulation of Novel Semiconductor Devices. ASICON (2021)
Toufik Sadi, Oves Badami, Vihar P. Georgiev, Jie Ding, Asen Asenov
Advanced Simulation of RRAM Memory Cells. ASICON (2019)
Toufik Sadi, Oves Badami, Vihar P. Georgiev, Asen Asenov
Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. LSSC (2019)
Cristina Medina-Bailon, Carlos Sampedro, José Luis Padilla, Luca Donetti, Vihar P. Georgiev, Francisco Gámiz, Asen Asenov
Techniques for Statistical Enhancement in a 2D Multi-subband Ensemble Monte Carlo Nanodevice Simulator. LSSC (2019)
Ryan W. Gardner, Corey Lowman, Casey Richardson, Ashley J. Llorens, Jared Markowitz, Nathan Drenkow, Andrew Newman, Gregory Clark, Gino Perrotta, Robert Perrotta, Timothy Highley, Vlad Shcherbina, William Bernadoni, Mark Jordan, Asen Asenov
The First International Competition in Machine Reconnaissance Blind Chess. NeurIPS (Competition and Demos) (2019)
Nedelcho Georgiev, Asen Asenov
Automatic Segmentation of Lumbar Spine MRI Using Ensemble of 2D Algorithms. CSI@MICCAI (2018)
Toufik Sadi, Asen Asenov
Microscopic KMC Modeling of Oxide RRAMs. NMA (2018)
Cristina Medina-Bailon, Toufik Sadi, Carlos Sampedro, José Luis Padilla, Luca Donetti, Vihar P. Georgiev, Francisco Gámiz, Asen Asenov
Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D MS-EMC Nanodevice Simulator. NMA (2018)
Mihail Nedjalkov, Paul Ellinghaus, Josef Weinbub, Toufik Sadi, Asen Asenov, Ivan Dimov, Siegfried Selberherr
Stochastic analysis of surface roughness models in quantum wires. Comput. Phys. Commun. 228 (2018)
Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma
TCAD based Design-Technology Co-Optimisations in advanced technology nodes. VLSI-DAT (2017)
Milen Petrov, Asen Asenov, Adelina Aleksieva-Petrova
Software Server for Automatic Generation of Audio Lectures (uListenSrv). Int. J. Adv. Corp. Learn. 10 (1) (2017)
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
Editorial. Microelectron. Reliab. 61 (2016)
Toufik Sadi, Liping Wang, Asen Asenov
Multi-scale electrothermal simulation and modelling of resistive random access memory devices. PATMOS (2016)
André Lange, Christoph Sohrmann, Roland Jancke, Joachim Haase, Binjie Cheng, Asen Asenov, Ulf Schlichtmann
Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (2) (2016)
Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marco Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
Experimental evidences and simulations of trap generation along a percolation path. ESSDERC (2015)
Saurabh Sinha, Lucian Shifren, Vikas Chandra, Brian Cline, Greg Yeric, Robert C. Aitken, Bingjie Cheng, Andrew R. Brown, Craig Riddet, C. Alexandar, Campbell Millar, Asen Asenov
Circuit design perspectives for Ge FinFET at 10nm and beyond. ISQED (2015)
Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marco Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC (2015)
Asen Asenov
Mastering CMOS variability is the key to success. IET Comput. Digit. Tech. 9 (4) (2015)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability. ESSDERC (2014)
Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov
RTN distribution comparison for bulk, FDSOI and FinFETs devices. Microelectron. Reliab. 54 (9-10) (2014)
Vihar P. Georgiev, Asen Asenov
Multi-scale Computational Framework for Evaluating of the Performance of Molecular Based Flash Cells. NMA (2014)
Vihar P. Georgiev, Salvatore M. Amoroso, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov
FDSOI molecular flash cell with reduced variability for low power flash applications. ESSDERC (2014)
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
Special section reliability and variability of devices for circuits and systems. Microelectron. Reliab. 54 (6-7) (2014)
Asen Asenov
Factoring variability in the Design/Technology Co Optimisation (DTCO) in advanced CMOS. ETS (2014)
Vihar P. Georgiev, Stanislav Markov, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov
Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage. ESSDERC (2013)
Asen Asenov, Craig Alexander, Craig Riddet, Ewan Towie
Predicting future technology performance. DAC (2013)
Liping Wang, Andrew R. Brown, Binjie Cheng, Asen Asenov
Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (12) (2013)
Xingsheng Wang, Binjie Cheng, Jente B. Kuang, Andrew R. Brown, Campbell Millar, Asen Asenov
Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. IEEE Des. Test 30 (6) (2013)
Negin Moezi, Daryoosh Dideban, Binjie Cheng, Scott Roy, Asen Asenov
Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study. Microelectron. J. 44 (1) (2013)
Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov
Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. ICICDT (2013)
Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov
SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. ISCAS (2013)
Jie Ding, Dave Reid, Campbell Millar, Asen Asenov
Investigation of SRAM using BTI-aware statistical compact models. ESSDERC (2013)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Jente B. Kuang, Sani R. Nassif, Asen Asenov
Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. ESSDERC (2013)
Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov
An advanced statistical compact model strategy for SRAM simulation at reduced VDD. ESSDERC (2012)
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
ICMAT 2011 - Reliability and variability of semiconductor devices and ICs. Microelectron. Reliab. 52 (8) (2012)
Louis Gerrer, Stanislav Markov, Salvatore M. Amoroso, Fikru Adamu-Lema, Asen Asenov
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov
A framework to study time-dependent variability in circuits at sub-35nm technology nodes. ISCAS (2012)
Muhammad Faiz Bukhori, Noor Ain Kamsani, Asen Asenov, Nazrul Anuar Nayan
Accurate capturing of the statistical aspect of NBTI/PBTI variability into statistical compact models. Microelectron. J. 43 (11) (2012)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. ESSDERC (2012)
Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. ESSDERC (2012)
James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell
The evolution of standard cell libraries for future technology nodes. Genet. Program. Evolvable Mach. 12 (3) (2011)
Antonio J. García-Loureiro, Natalia Seoane, Manuel Aldegunde, Raúl Valín Ferreiro, Asen Asenov, A. Martinez, Karol Kalna
Implementation of the Density Gradient Quantum Corrections for 3-D Simulations of Multigate Nanoscaled Transistors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (6) (2011)
Asen Asenov, Andrew R. Brown, Binjie Cheng
Statistical aspects of NBTI/PBTI and impact on SRAM yield. DATE (2011)
Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE (2011)
Asen Asenov
Advanced Monte Carlo Techniques in the Simulation of CMOS Devices and Circuits. NMA (2010)
Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov
Statistical NBTI-effect prediction for ULSI circuits. ISCAS (2010)
Brahim Benbakhti, J. S. Ayubi-Moak, Karol Kalna, D. Lin, Geert Hellings, Guy Brammertz, Kristin De Meyer, Iain Thayne, Asen Asenov
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectron. Reliab. 50 (3) (2010)
Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
Capturing intrinsic parameter fluctuations using the PSP compact model. DATE (2010)
Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. IEEE Des. Test Comput. 27 (2) (2010)
Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy
Modeling and simulation of transistor and circuit variability and reliability. CICC (2010)
Noor Ain Kamsani, Binjie Cheng, Scott Roy, Asen Asenov
Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability. ISCAS (2009)
Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Robert Stewart
Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC (2009)
Richard O. Sinnott, Christopher Bayliss, C. Davenhall, Bruno Harbulot, Mike Jones, Campbell Millar, Gareth Roy, Scott Roy, Gordon Stewart, John P. Watt, Asen Asenov
Secure, Performance-Oriented Data Management for nanoCMOS Electronics. eScience (2008)
Richard O. Sinnott, Campbell Millar, Asen Asenov
Supercomputing at Work in the nanoCMOS Electronics Domain. ERCIM News 2008 (74) (2008)
Muhammad Faiz Bukhori, Scott Roy, Asen Asenov
Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. Microelectron. Reliab. 48 (8-9) (2008)
Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectron. Reliab. 48 (8-9) (2008)
Richard O. Sinnott, Christopher Bayliss, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt, Asen Asenov, Gareth Roy, Scott Roy, C. Davenhall, Bruno Harbulot, M. Jones
Integrating Security Solutions to Support nanoCMOS Electronics Research. ISPA (2008)
Liangxiu Han, Asen Asenov, Dave Berry, Campbell Millar, Gareth Roy, Scott Roy, Richard O. Sinnott, Gordon Stewart
Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. eScience (2007)
Asen Asenov
Statistical Device Variability and its Impact on Yield and Performance. IOLTS (2007)
Natalia Seoane, Antonio J. García-Loureiro, Karol Kalna, Asen Asenov
A High-Performance Parallel Device Simulator for High Electron Mobility Transistors. PARCO (2005)
Binjie Cheng, Scott Roy, Asen Asenov
The impact of random doping effects on CMOS SRAM cell. ESSCIRC (2004)
L. Yang, Asen Asenov, J. R. Watling, M. Boriçi, John R. Barker, Scott Roy, K. Elgaid, Iain Thayne, T. Hackbarth
Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs. Microelectron. Reliab. 44 (7) (2004)
Karol Kalna, Asen Asenov
Nonequilibrium and ballistic transport, and backscattering in decanano HEMTs: a Monte Carlo simulation study. Math. Comput. Simul. 62 (3-6) (2003)
J. R. Watling, John R. Barker, Asen Asenov
Soft Sphere Model for Electron Correlation and Scattering in the Atomistic Modelling of Semiconductor Devices. VLSI Design 2001 (1) (2001)
Karol Kalna, Asen Asenov, K. Elgaid, Iain Thayne
Scaling of pHEMTs to Decanano Dimensions. VLSI Design 2001 (1) (2001)
J. R. Watling, Y. P. Zhao, Asen Asenov, John R. Barker
-MOSFETs. VLSI Design 2001 (1) (2001)
John R. Barker, Asen Asenov
IWCE-7 Committees. VLSI Design 2001 (1) (2001)
Asen Asenov, Gabriela Slavcheva, Savas Kaya, R. Balasubramaniam
Quantum Corrections to the 'Atomistic' MOSFET Simulations. VLSI Design 2001 (1) (2001)
Asen Asenov, Andrew R. Brown, John H. Davies, Subhash Saini
Hierarchical approach to "atomistic" 3-D MOSFET simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (11) (1999)
Andrew R. Brown, Asen Asenov, John R. Barker
3D Parallel Finite Element Simulation of In-Cell Breakdown in Lateral-Channel IGBTs. VLSI Design 1998 (1) (1998)
Clinton R. Arokianathan, Asen Asenov, John H. Davies
A New Approach based on Brownian Motion for the Simulation of Ultra-Small Semiconductor Devices. VLSI Design 1998 (1) (1998)
S. Babiker, Asen Asenov, N. Cameron, S. P. Beaumont, John R. Barker
Complete RF Analysis of Compound FETs Based on Transient Monte Carlo Simulation. VLSI Design 1998 (1) (1998)
Asen Asenov, Andrew R. Brown, Scott Roy, J. R. Barker
Topologically Rectangular Grids in the Parallel Simulation of Semiconductor Devices. VLSI Design 1998 (1) (1998)
Sumit Roy, Asen Asenov, S. Babiker, John R. Barker, S. P. Beaumont
RF Performance of Si/SiGe MODFETs: A Simulation Study. VLSI Design 1998 (1) (1998)
S. Babiker, Asen Asenov, John R. Barker, S. P. Beaumont
Quadrilateral Finite Element Monte Carlo Simulation of Complex Shape Compound FETs. VLSI Design 1998 (1) (1998)
Clinton R. Arokianathan, J. H. Davies, Asen Asenov
Ab-initio Coulomb Scattering in Atomistic Device Simulation. VLSI Design 1998 (1) (1998)
Asen Asenov, S. Babiker, S. P. Beaumont, John R. Barker
Monte Carlo Calibrated Drift-Diffusion Simulation of Short Channel HFETs. VLSI Design 1998 (1) (1998)
Scott Roy, Asen Asenov, John R. Barker
Optimum partitioning of topologically rectangular grids. EUROSIM (1996)
Asen Asenov, John R. Barker, Andrew R. Brown, G. L. Lee
Scalable parallel 3D finite element nonlinear Poisson solver. Simul. Pract. Theory 4 (2-3) (1996)
Asen Asenov, Dave Reid, John R. Barker
Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. Parallel Comput. 21 (4) (1995)
Asen Asenov, John R. Barker, Andrew R. Brown, G. L. Lee
Scalable Parallel 3D Finite Element Nonlinear Poisson Solver. EUROSIM (1994)
Asen Asenov, Dave Reid, John R. Barker
Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. Parallel Comput. 20 (3) (1994)
John R. Barker, Asen Asenov, Andrew R. Brown, J. Cluckie, S. Babiker, Clinton R. Arokianathan
Parallel Simulation of Semiconductor Devices. EUROSIM (1994)