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Plamen Asenov
Publication Activity (10 Years)
Years Active: 2011-2024
Publications (10 Years): 5
Top Topics
Advanced Technology
Floating Gate
Metal Oxide Semiconductor
Buffer Management
Top Venues
IRPS
ISQED
IMW
VLSI Technology and Circuits
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Publications
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Leitao Liu
,
Jingtian Fang
,
Ashish Pal
,
Plamen Asenov
,
Mohit Bajaj
,
Bei Deng
,
Xi-Wei Lin
,
Souvik Mahapatra
,
Subi Kengeri
,
El Mehdi Bazizi
Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology.
IRPS
(2024)
Xi-Wei Lin
,
Salvatore M. Amoroso
,
Ko-Hsin Lee
,
Meng Hsuan Ke
,
Tue Gunst
,
Pavel Tikhomirov
,
Plamen Asenov
Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development.
IMW
(2024)
Victor Moroz
,
Alexei Svizhenko
,
Munkang Choi
,
Plamen Asenov
,
Jaehyun Lee
Exploring Power Savings of Gate-All-Around Cryogenic Technology.
VLSI Technology and Circuits
(2023)
Asen Asenov
,
Karim El Sayed
,
Ricardo Borges
,
Plamen Asenov
,
Campbell Millar
,
Terry Ma
TCAD based Design-Technology Co-Optimisations in advanced technology nodes.
VLSI-DAT
(2017)
A. Asenov
,
Yangang Wang
,
B. Cheng
,
Xingsheng Wang
,
Plamen Asenov
,
Talib Al-Ameri
,
Vihar P. Georgiev
Nanowire transistor solutions for 5nm and beyond.
ISQED
(2016)
A. Asenov
,
Jie Ding
,
Dave Reid
,
Plamen Asenov
,
Salvatore M. Amoroso
,
Fikru Adamu-Lema
,
Louis Gerrer
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.
ISCAS
(2015)
Plamen Asenov
,
David New
,
Dave Reid
,
Campbell Millar
,
Scott Roy
,
Asen Asenov
Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.
ICICDT
(2013)
Plamen Asenov
,
Dave Reid
,
Scott Roy
,
Campbell Millar
,
Asen Asenov
An advanced statistical compact model strategy for SRAM simulation at reduced VDD.
ESSDERC
(2012)
Michael Merrett
,
Plamen Asenov
,
Yangang Wang
,
Mark Zwolinski
,
Dave Reid
,
Campbell Millar
,
Scott Roy
,
Zhenyu Liu
,
Stephen B. Furber
,
Asen Asenov
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.
DATE
(2011)