Salvatore M. Amoroso

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 6

Top Topics

Reliability Assessment

Carbon Nanotubes

Molecular Dynamics Simulations

Top Venues

Microelectron. Reliab.

Publications

Xi-Wei Lin, Salvatore M. Amoroso, Ko-Hsin Lee, Meng Hsuan Ke, Tue Gunst, Pavel Tikhomirov, Plamen Asenov
Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development. IMW (2024)
B. Uhlig, J. Liang, J. Lee, Raphael Ramos, A. Dhavamani, N. Nagy, J. Dijon, H. Okuno, D. Kalita, Vihar P. Georgiev, A. Asenov, Salvatore M. Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, G. Goncalves, B. Chen, R. R. Pandey, R. Chen, Aida Todri-Sanial
Progress on carbon nanotube BEOL interconnects. DATE (2018)
Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marco Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
Experimental evidences and simulations of trap generation along a percolation path. ESSDERC (2015)
Louis Gerrer, Vihar P. Georgiev, Salvatore M. Amoroso, Ewan Towie, A. Asenov
Comparison of Si and crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations. Microelectron. Reliab. 55 (9-10) (2015)
Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marco Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC (2015)
A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. ISCAS (2015)
Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov
RTN distribution comparison for bulk, FDSOI and FinFETs devices. Microelectron. Reliab. 54 (9-10) (2014)
Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54 (4) (2014)
Vihar P. Georgiev, Salvatore M. Amoroso, Laia Vila-Nadal, Cristoph Busche, Leroy Cronin, Asen Asenov
FDSOI molecular flash cell with reduced variability for low power flash applications. ESSDERC (2014)
Louis Gerrer, Stanislav Markov, Salvatore M. Amoroso, Fikru Adamu-Lema, Asen Asenov
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. ESSDERC (2012)