Razaidi Hussin

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 8

Top Topics

Fault Detection

Optimization Strategy

Semiconductor Devices

Computational Complexity

Top Venues

Microelectron. Reliab.

Publications

Aiman Zakwan Jidin, Razaidi Hussin, Lee Weng Fook, Mohd Syafiq Mispan
MBIST Implementation and Evaluation in FPGA Based on Low-Complexity March Algorithms. J. Circuits Syst. Comput. 33 (8) (2024)
Loh Wan Ying, Weng Fook Lee, Razaidi Hussin, Aiman Zakwan Jidin, Norhawati Ahmad, Nor Azura Zakaria
Novel March WY Approach for Dynamic Fault Detection in Memory BIST. MCSoC (2023)
Aiman Zakwan Jidin, Razaidi Hussin, Lee Weng Fook, Mohd Syafiq Mispan, Nor Azura Zakaria, Loh Wan Ying, Norshuhani Zamin
Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (8) (2023)
Aiman Zakwan Jidin, Razaidi Hussin, Mohd Syafiq Mispan, Lee Weng Fook
Novel March Test Algorithm Optimization Strategy for Improving Unlinked Faults Detection. APCCAS (2021)
Aiman Zakwan Jidin, Razaidi Hussin, Lee Weng Fook, Mohd Syafiq Mispan
An Automation Program for March Algorithm Fault Detection Analysis. APCCAS (2021)
Goh Yie Yen, Siti Zarina Md. Naziri, Rizalafande Che Ismail, Mohd Nazrin Md. Isa, Razaidi Hussin
Design of Multiplicative Inverse Value Generator using Logarithm Method for AES Algorithm. ICM (2020)
Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marco Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
Experimental evidences and simulations of trap generation along a percolation path. ESSDERC (2015)
Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marco Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC (2015)
Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov
RTN distribution comparison for bulk, FDSOI and FinFETs devices. Microelectron. Reliab. 54 (9-10) (2014)
Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54 (4) (2014)