Campbell Millar

Publication Activity (10 Years)

Years Active: 2007-2018
Publications (10 Years): 3

Top Topics

Design Considerations

Advanced Technology

Monte Carlo Simulation

Statistical Models

Top Venues

Publications

B. Uhlig, J. Liang, J. Lee, Raphael Ramos, A. Dhavamani, N. Nagy, J. Dijon, H. Okuno, D. Kalita, Vihar P. Georgiev, A. Asenov, Salvatore M. Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, G. Goncalves, B. Chen, R. R. Pandey, R. Chen, Aida Todri-Sanial
Progress on carbon nanotube BEOL interconnects. DATE (2018)
Asen Asenov, Karim El Sayed, Ricardo Borges, Plamen Asenov, Campbell Millar, Terry Ma
TCAD based Design-Technology Co-Optimisations in advanced technology nodes. VLSI-DAT (2017)
Saurabh Sinha, Lucian Shifren, Vikas Chandra, Brian Cline, Greg Yeric, Robert C. Aitken, Bingjie Cheng, Andrew R. Brown, Craig Riddet, C. Alexandar, Campbell Millar, Asen Asenov
Circuit design perspectives for Ge FinFET at 10nm and beyond. ISQED (2015)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability. ESSDERC (2014)
Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54 (4) (2014)
Xingsheng Wang, Binjie Cheng, Jente B. Kuang, Andrew R. Brown, Campbell Millar, Asen Asenov
Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. IEEE Des. Test 30 (6) (2013)
Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov
Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. ICICDT (2013)
Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov
SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. ISCAS (2013)
Jie Ding, Dave Reid, Campbell Millar, Asen Asenov
Investigation of SRAM using BTI-aware statistical compact models. ESSDERC (2013)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Jente B. Kuang, Sani R. Nassif, Asen Asenov
Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. ESSDERC (2013)
Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov
An advanced statistical compact model strategy for SRAM simulation at reduced VDD. ESSDERC (2012)
Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov
Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. ESSDERC (2012)
James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell
The evolution of standard cell libraries for future technology nodes. Genet. Program. Evolvable Mach. 12 (3) (2011)
Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE (2011)
Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
Capturing intrinsic parameter fluctuations using the PSP compact model. DATE (2010)
Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov
Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. IEEE Des. Test Comput. 27 (2) (2010)
Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy
Modeling and simulation of transistor and circuit variability and reliability. CICC (2010)
Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Robert Stewart
Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC (2009)
Richard O. Sinnott, Christopher Bayliss, C. Davenhall, Bruno Harbulot, Mike Jones, Campbell Millar, Gareth Roy, Scott Roy, Gordon Stewart, John P. Watt, Asen Asenov
Secure, Performance-Oriented Data Management for nanoCMOS Electronics. eScience (2008)
Richard O. Sinnott, Campbell Millar, Asen Asenov
Supercomputing at Work in the nanoCMOS Electronics Domain. ERCIM News 2008 (74) (2008)
Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectron. Reliab. 48 (8-9) (2008)
Richard O. Sinnott, Christopher Bayliss, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt, Asen Asenov, Gareth Roy, Scott Roy, C. Davenhall, Bruno Harbulot, M. Jones
Integrating Security Solutions to Support nanoCMOS Electronics Research. ISPA (2008)
Richard O. Sinnott, Thomas Doherty, David B. Martin, Campbell Millar, Gordon Stewart, John P. Watt
Supporting Security-Oriented, Collaborative nanoCMOS Electronics Research. ICCS (1) (2008)
Liangxiu Han, Asen Asenov, Dave Berry, Campbell Millar, Gareth Roy, Scott Roy, Richard O. Sinnott, Gordon Stewart
Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. eScience (2007)