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Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability.
Xingsheng Wang
Binjie Cheng
Andrew R. Brown
Campbell Millar
Asen Asenov
Published in:
ESSDERC (2014)
Keyphrases
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databases
image analysis
neural network
artificial intelligence
search engine
computationally efficient
design process
statistical models
power consumption
numerical simulations
highly accurate