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Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design.
Xingsheng Wang
Binjie Cheng
Andrew R. Brown
Campbell Millar
Asen Asenov
Published in:
ESSDERC (2012)
Keyphrases
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case study
design process
building blocks
computer aided
neural network
data driven
statistical analysis
statistical models
design tools