Louis Gerrer

Publication Activity (10 Years)

Years Active: 2012-2021
Publications (10 Years): 6

Top Topics

Statistical Information

Metal Oxide Semiconductor

Top Venues

Microelectron. Reliab.

Publications

Tadeu Mota Frutuoso, Jose Lugo-Alvarez, Xavier Garros, Laurent Brunet, Joris Lacord, Louis Gerrer, Mikaël Cassé, Edoardo Catapano, Claire Fenouillet-Béranger, François Andrieu, Fred Gaillard, Philippe Ferrari
Impact of spacer interface charges on performance and reliability of low temperature transistors for 3D sequential integration. IRPS (2021)
Louis Gerrer, Jacques Cluzel, Fred Gaillard, Xavier Garros, Xavier Federspiel, Florian Cacho, David Roy, E. Vincent
BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. IRPS (2021)
Louis Gerrer, Razaidi Hussin, Salvatore M. Amoroso, Jacopo Franco, Pieter Weckx, Marco Simicic, N. Horiguchi, Ben Kaczer, Tibor Grasser, Asen Asenov
Experimental evidences and simulations of trap generation along a percolation path. ESSDERC (2015)
Louis Gerrer, Vihar P. Georgiev, Salvatore M. Amoroso, Ewan Towie, A. Asenov
Comparison of Si and crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations. Microelectron. Reliab. 55 (9-10) (2015)
Razaidi Hussin, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marco Simicic, Jacopo Franco, Annelies Vanderheyden, Danielle Vanhaeren, Naoto Horiguchi, Ben Kaczer, Asen Asenov
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC (2015)
A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. ISCAS (2015)
Louis Gerrer, Salvatore M. Amoroso, Razaidi Hussin, Asen Asenov
RTN distribution comparison for bulk, FDSOI and FinFETs devices. Microelectron. Reliab. 54 (9-10) (2014)
Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54 (4) (2014)
Louis Gerrer, Stanislav Markov, Salvatore M. Amoroso, Fikru Adamu-Lema, Asen Asenov
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. Microelectron. Reliab. 52 (9-10) (2012)
Salvatore M. Amoroso, Louis Gerrer, Stanislav Markov, Fikru Adamu-Lema, Asen Asenov
Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. ESSDERC (2012)