Florian Cacho

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 41

Top Topics

Failure Prediction

Comprehensive Analysis

Digital Circuits

Silicon On Insulator

Top Venues

Microelectron. Reliab.

Publications

Florian Cacho, P. Cathelin, Joycelyn Hai, S. Bouvot, J. Nowakowski, M. Martinez, R. Debroucke, S. Jean, R. Paulin, J. Antonijevic, X. Federspiel, Nicolas Planes, Giuseppe Papotto, Alessandro Parisi, Alessandro Finocchiaro, Andrea Cavarra, Alessandro Castorina, Claudio Nocera, Giuseppe Palmisano
Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS. IRPS (2024)
X. Federspiel, Cheikh Diouf, B. Arunachalam, David Roy, Florian Cacho
Non-conducting Hot carrier temperature activation and temperature sense effect. IRPS (2024)
A. Divay, Cédric Dehos, Ismael Charlet, Fred Gaillard, B. Duriez, Xavier Garros, J. Antonijevic, Joycelyn Hai, Nathalie Revil, Jeremie Forest, Vincent Knopik, Florian Cacho, David Roy, X. Federspiel, S. Crémer, Pascal Chevalier
A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles. IRPS (2024)
J. Hai, Florian Cacho, X. Federspiel, Tidjani Garba-Seybou, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould
Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation. IRPS (2023)
Yunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel
Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging. IOLTS (2023)
Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix
Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. IRPS (2023)
J. Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros
Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. IRPS (2022)
M. Arabi, X. Federspiel, Florian Cacho, M. Rafik, S. Blonkowski, Xavier Garros, G. Guibaudo
Frequency dependant gate oxide TDDB model. IRPS (2022)
Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho
New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes. IRPS (2022)
Kedar Janardan Dhori, Promod Kumar, Christophe Lecocq, Pascal Urard, Olivier Callen, Florian Cacho, Maryline Parra, Prashant Pandey, Daniel Noblet
40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode. VLSID (2022)
Lorena Anghel, Florian Cacho
Design-Time Exploration for Process, Environment and Aging Compensation Techniques for Low Power Reliable-Aware Design. IEEE Trans. Emerg. Top. Comput. 10 (2) (2022)
Xavier Federspiel, Abdourahmane Camara, Audrey Michard, Cheikh Diouf, Florian Cacho
HCI Temperature sense effect from 180nm to 28nm nodes. IRPS (2021)
Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho
Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling. IRPS (2021)
Florian Cacho, Lorena Anghel, Xavier Federspiel
Monitoring Setup and Hold Timing Limits. IRPS (2021)
Louis Gerrer, Jacques Cluzel, Fred Gaillard, Xavier Garros, Xavier Federspiel, Florian Cacho, David Roy, E. Vincent
BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. IRPS (2021)
Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS. IRPS (2020)
Xavier Federspiel, Cheikh Diouf, Florian Cacho, Emmanuel Vincent
Comparison of variability of HCI induced drift for SiON and HKMG devices. IRPS (2020)
Audrey Michard, Florian Cacho, Damien Celeste, Xavier Federspiel
Global and Local Process Variation Simulations in Design for Reliability approach. IOLTS (2019)
Florian Cacho, X. Federspiel, D. Nouguier, Cheikh Diouf
Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement. IRPS (2019)
A. P. Nguyen, Xavier Garros, M. Rafik, Florian Cacho, David Roy, Xavier Federspiel, F. Gaillard
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology. IRPS (2019)
Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel
NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI. DATE (2018)
Florian Cacho, D. Nouguier, M. Arabi, X. Federspiel, Y. Carminati, M. Saliva
Integrated Test Structures for Reliability Investigation under Dynamic Stimuli. IOLTS (2018)
Riddhi Jitendrakumar Shah, Florian Cacho, Vincent Huard, Souhir Mhira, D. Arora, P. Agarwal, S. Kumar, S. Balaraman, B. Singh, Lorena Anghel
Investigation of speed sensors accuracy for process and aging compensation. IRPS (2018)
R. Lajmi, Florian Cacho, O. David, Jean-Pierre Blanc, Emmanuel Rouat, Sébastien Haendler, Ph. Benech, Estelle Lauga-Larroze, Sylvain Bourdel
Reliability assessment of 4GSP/s interleaved SAR ADC. IRPS (2018)
R. Lajmi, Florian Cacho, Estelle Lauga-Larroze, Sylvain Bourdel, Ph. Benech, Vincent Huard, X. Federspiel
Characterization of Low Drop-Out during ageing and design for yield. Microelectron. Reliab. (2017)
Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Souhir Mhira, Florian Cacho, Lorena Anghel
Workload dependent reliability timing analysis flow. DATE (2017)
Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, A. Jain, C. R. Parthasarathy, Alain Bravaix
Dynamic aging compensation and Safety measures in Automotive environment. IOLTS (2017)
Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel
Investigation of critical path selection for in-situ monitors insertion. IOLTS (2017)
Kedar Janardan Dhori, Hitesh Chawla, Ashish Kumar, Prashant Pandey, Promod Kumar, Lorenzo Ciampolini, Florian Cacho, Damien Croain
High-yield design of high-density SRAM for low-voltage and low-leakage operations. DFT (2017)
Vincent Huard, Souhir Mhira, Florian Cacho, Alain Bravaix
Enabling robust automotive electronic components in advanced CMOS nodes. Microelectron. Reliab. (2017)
Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, A. Jain, C. R. Parthasarathy, Alain Bravaix
Cognitive approach to support dynamic aging compensation. ITC (2017)
Alain Bravaix, Florian Cacho, X. Federspiel, C. Ndiaye, Souhir Mhira, Vincent Huard
Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. Microelectron. Reliab. 64 (2016)
Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, C. Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard
Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. IOLTS (2016)
Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, V. Knopik, A. Jain, C. R. Parthasarathy, Lorena Anghel
Activity profiling: Review of different solutions to develop reliable and performant design. IOLTS (2016)
Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel
Study of workload impact on BTI HCI induced aging of digital circuits. DATE (2016)
Rossella Ranica, Nicolas Planes, Vincent Huard, Olivier Weber, D. Noblet, Damien Croain, Fabien Giner, Sylvie Naudet, P. Mergault, S. Ibars, A. Villaret, M. Parra, Sébastien Haendler, M. Quoirin, Florian Cacho, C. Julien, F. Terrier, Lorenzo Ciampolini, David Turgis, Christophe Lecocq, Franck Arnaud
28nm FDSOI technology sub-0.6V SRAM Vmin assessment for ultra low voltage applications. VLSI Circuits (2016)
Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard
Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. VTS (2016)
C. Ndiaye, Vincent Huard, X. Federspiel, Florian Cacho, Alain Bravaix
Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. Microelectron. Reliab. 64 (2016)
Ahmed Benhassain, Souhir Mhira, Florian Cacho, Vincent Huard, Lorena Anghel
In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability. IVSW (2016)
Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. ERMAVSS@DATE (2016)
Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel
Early failure prediction by using in-situ monitors: Implementation and application results. ERMAVSS@DATE (2016)
Ahmed Benhassain, Florian Cacho, Vincent Huard, M. Saliva, Lorena Anghel, C. R. Parthasarathy, A. Jain, Fabien Giner
Timing in-situ monitors: Implementation strategy and applications results. CICC (2015)
M. Saliva, Florian Cacho, C. Ndiaye, Vincent Huard, D. Angot, Alain Bravaix, Lorena Anghel
Impact of gate oxide breakdown in logic gates from 28nm FDSOI CMOS technology. IRPS (2015)
P. Mora, X. Federspiel, Florian Cacho, Vincent Huard, W. Arfaoui
28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation. IRPS (2015)
M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel
Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. DATE (2015)
Vincent Huard, D. Angot, Florian Cacho
From BTI variability to product failure rate: A technology scaling perspective. IRPS (2015)
Laurent Negre, David Roy, Florian Cacho, Patrick Scheer, Sebastien Jan, Samuel Boret, Daniel Gloria, Gérard Ghibaudo
Reliability Characterization and Modeling Solution to Predict Aging of 40-nm MOSFET DC and RF Performances Induced by RF Stresses. IEEE J. Solid State Circuits 47 (5) (2012)
Vincent Huard, N. Ruiz Amador, Florian Cacho, E. Pion
A bottom-up approach for System-On-Chip reliability. Microelectron. Reliab. 51 (9-11) (2011)
N. Ruiz Amador, Vincent Huard, E. Pion, Florian Cacho, Damien Croain, V. Robert, Sylvain Engels, Philippe Flatresse, Lorena Anghel
Bottom-up digital system-level reliability modeling. CICC (2011)
Florian Cacho, S. Orain, G. Cailletaud, H. Jaouen
A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and STI in MOS technologies. Microelectron. Reliab. 47 (2-3) (2007)