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Cheikh Diouf
Publication Activity (10 Years)
Years Active: 2015-2023
Publications (10 Years): 8
Top Topics
Metal Oxide
Dynamic Behavior
Low Frequency
Reliability Assessment
Top Venues
IRPS
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Publications
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C. Doyen
,
V. Yon
,
Xavier Garros
,
Luigi Basset
,
Tadeu Mota Frutuoso
,
C. Dagon
,
Cheikh Diouf
,
X. Federspiel
,
V. Millon
,
Frederic Monsieur
,
C. Pribat
,
David Roy
Insight Into HCI Reliability on I/O Nitrided Devices.
IRPS
(2023)
Xavier Federspiel
,
Abdourahmane Camara
,
Audrey Michard
,
Cheikh Diouf
,
Florian Cacho
HCI Temperature sense effect from 180nm to 28nm nodes.
IRPS
(2021)
Xavier Federspiel
,
Cheikh Diouf
,
Florian Cacho
,
Emmanuel Vincent
Comparison of variability of HCI induced drift for SiON and HKMG devices.
IRPS
(2020)
Cheikh Diouf
,
N. Guitard
,
M. Rafik
,
J. J. Martinez
,
X. Federspiel
,
Alain Bravaix
,
D. Muller
,
David Roy
Process Optimization for HCI Improvement in I/O Analog Devices.
IRPS
(2019)
Florian Cacho
,
X. Federspiel
,
D. Nouguier
,
Cheikh Diouf
Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement.
IRPS
(2019)
Xavier Garros
,
Alexandre Subirats
,
Gilles Reimbold
,
F. Gaillard
,
Cheikh Diouf
,
X. Federspiel
,
Vincent Huard
,
M. Rafik
A new method for quickly evaluating reversible and permanent components of the BTI degradation.
IRPS
(2018)
M. Rafik
,
A. P. Nguyen
,
Xavier Garros
,
M. Arabi
,
X. Federspiel
,
Cheikh Diouf
AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment.
IRPS
(2018)
A. Bezza
,
M. Rafik
,
David Roy
,
X. Federspiel
,
P. Mora
,
Cheikh Diouf
,
Vincent Huard
,
Gérard Ghibaudo
Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment.
IRPS
(2015)