Cheikh Diouf

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 9

Top Topics

Dynamic Behavior

Solar Radiation

Measurement Error

Top Venues

Publications

X. Federspiel, Cheikh Diouf, B. Arunachalam, David Roy, Florian Cacho
Non-conducting Hot carrier temperature activation and temperature sense effect. IRPS (2024)
C. Doyen, V. Yon, Xavier Garros, Luigi Basset, Tadeu Mota Frutuoso, C. Dagon, Cheikh Diouf, X. Federspiel, V. Millon, Frederic Monsieur, C. Pribat, David Roy
Insight Into HCI Reliability on I/O Nitrided Devices. IRPS (2023)
Xavier Federspiel, Abdourahmane Camara, Audrey Michard, Cheikh Diouf, Florian Cacho
HCI Temperature sense effect from 180nm to 28nm nodes. IRPS (2021)
Xavier Federspiel, Cheikh Diouf, Florian Cacho, Emmanuel Vincent
Comparison of variability of HCI induced drift for SiON and HKMG devices. IRPS (2020)
Cheikh Diouf, N. Guitard, M. Rafik, J. J. Martinez, X. Federspiel, Alain Bravaix, D. Muller, David Roy
Process Optimization for HCI Improvement in I/O Analog Devices. IRPS (2019)
Florian Cacho, X. Federspiel, D. Nouguier, Cheikh Diouf
Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement. IRPS (2019)
Xavier Garros, Alexandre Subirats, Gilles Reimbold, F. Gaillard, Cheikh Diouf, X. Federspiel, Vincent Huard, M. Rafik
A new method for quickly evaluating reversible and permanent components of the BTI degradation. IRPS (2018)
M. Rafik, A. P. Nguyen, Xavier Garros, M. Arabi, X. Federspiel, Cheikh Diouf
AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment. IRPS (2018)
A. Bezza, M. Rafik, David Roy, X. Federspiel, P. Mora, Cheikh Diouf, Vincent Huard, Gérard Ghibaudo
Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment. IRPS (2015)