Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment.
A. BezzaM. RafikDavid RoyX. FederspielP. MoraCheikh DioufVincent HuardGérard GhibaudoPublished in: IRPS (2015)
Keyphrases
- low frequency
- high frequency
- wavelet transform
- frequency domain
- subband
- electromagnetic fields
- wavelet coefficients
- frequency band
- field effect transistors
- wavelet analysis
- high frequency components
- instructional technology
- discrete wavelet transform
- cmos technology
- low and high frequency
- high quality
- contourlet transform
- energy consumption
- image restoration
- high resolution
- multiresolution