M. Rafik

Publication Activity (10 Years)

Years Active: 2009-2022
Publications (10 Years): 9

Top Topics

Cmos Technology

Electromagnetic Fields

Web Intelligence

Top Venues

Microelectron. Reliab.

Publications

M. Arabi, X. Federspiel, Florian Cacho, M. Rafik, S. Blonkowski, Xavier Garros, G. Guibaudo
Frequency dependant gate oxide TDDB model. IRPS (2022)
Cheikh Diouf, N. Guitard, M. Rafik, J. J. Martinez, X. Federspiel, Alain Bravaix, D. Muller, David Roy
Process Optimization for HCI Improvement in I/O Analog Devices. IRPS (2019)
A. P. Nguyen, Xavier Garros, M. Rafik, Florian Cacho, David Roy, Xavier Federspiel, F. Gaillard
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology. IRPS (2019)
Xavier Garros, Alexandre Subirats, Gilles Reimbold, F. Gaillard, Cheikh Diouf, X. Federspiel, Vincent Huard, M. Rafik
A new method for quickly evaluating reversible and permanent components of the BTI degradation. IRPS (2018)
D. Nouguier, X. Federspiel, Gérard Ghibaudo, M. Rafik, David Roy
New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges. Microelectron. Reliab. 87 (2018)
M. Rafik, A. P. Nguyen, Xavier Garros, M. Arabi, X. Federspiel, Cheikh Diouf
AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment. IRPS (2018)
M. Arabi, A. Cros, X. Federspiel, C. Ndiaye, Vincent Huard, M. Rafik
Modeling self-heating effects in advanced CMOS nodes. IRPS (2018)
G. Besnard, Xavier Garros, Alexandre Subirats, François Andrieu, X. Federspiel, M. Rafik, Walter Schwarzenbach, Gilles Reimbold, Olivier Faynot, Sorin Cristoloveanu
Performance and reliability of strained SOI transistors for advanced planar FDSOI technology. IRPS (2015)
A. Bezza, M. Rafik, David Roy, X. Federspiel, P. Mora, Cheikh Diouf, Vincent Huard, Gérard Ghibaudo
Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment. IRPS (2015)
Franck Arnaud, L. Pinzelli, C. Gallon, M. Rafik, P. Mora, Frédéric Boeuf
Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies. Microelectron. Reliab. 51 (9-11) (2011)
L. Gerrer, M. Rafik, G. Ribes, Gérard Ghibaudo, E. Vincent
Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation. Microelectron. Reliab. 50 (9-11) (2010)
Xavier Garros, Mikaël Cassé, M. Rafik, Claire Fenouillet-Béranger, Gilles Reimbold, F. Martin, Claudia Wiemer, F. Boulanger
Process dependence of BTI reliability in advanced HK MG stacks. Microelectron. Reliab. 49 (9-11) (2009)