Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies.
Franck ArnaudL. PinzelliC. GallonM. RafikP. MoraFrédéric BoeufPublished in: Microelectron. Reliab. (2011)
Keyphrases
- lessons learned
- innovative approaches
- high speed
- power consumption
- advanced technologies
- low power
- business opportunities
- low cost
- data mining
- legal issues
- cmos technology
- future trends
- interactive systems
- power supply
- open issues
- emerging technologies
- technical challenges
- key issues
- real time
- practical experiences
- failure rate
- software product line
- intra class
- key technologies
- case study
- enabling technologies
- metal oxide semiconductor
- nm technology