G. Ribes

Publication Activity (10 Years)

Years Active: 2003-2015
Publications (10 Years): 0

Top Topics

Electrical Properties

Data Processing

Technological Advances

Top Venues

Publications

M. Akbal, G. Ribes, M. Guillermet, L. Vallier
Plasma induced damage investigation in the fully depleted SOI technology. ICICDT (2015)
M. Akbal, G. Ribes, L. Vallier
New insight in plasma charging impact on gate oxide breakdown in FDSOI technology. IRPS (2015)
L. Gerrer, M. Rafik, G. Ribes, Gérard Ghibaudo, E. Vincent
Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation. Microelectron. Reliab. 50 (9-11) (2010)
L. Gerrer, Gérard Ghibaudo, G. Ribes
Oxide Soft Breakdown : From device modeling to small circuit simulation. ESSCIRC (2009)
C. R. Parthasarathy, M. Denais, Vincent Huard, G. Ribes, David Roy, Chloe Guérin, F. Perrier, E. Vincent, Alain Bravaix
Designing in reliability in advanced CMOS technologies. Microelectron. Reliab. 46 (9-11) (2006)
G. Ribes, S. Bruyère, M. Denais, David Roy, Gérard Ghibaudo
Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown. Microelectron. Reliab. 45 (5-6) (2005)
G. Ribes, S. Bruyère, M. Denais, Frederic Monsieur, Vincent Huard, David Roy, Gérard Ghibaudo
power-law voltage dependence of oxide breakdown in ultra-thin gate oxides. Microelectron. Reliab. 45 (12) (2005)
G. Ribes, S. Bruyère, Frederic Monsieur, David Roy, Vincent Huard
New insights into the change of voltage acceleration and temperature activation of oxide breakdown. Microelectron. Reliab. 43 (8) (2003)