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New insights into the change of voltage acceleration and temperature activation of oxide breakdown.
G. Ribes
S. Bruyère
Frederic Monsieur
David Roy
Vincent Huard
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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room temperature
leakage current
low voltage
electric field
electrical properties
silicon dioxide
metal oxide
high temperature
power system
electrical power
thin film
field effect transistors
neural network
data mining
high voltage
temperature control
dynamic range
magnetic field