ELECTRICAL PROPERTIES
Experts
- Samuel P. Benz
- Ralf Behr
- Hei Wong
- Alain Rüfenacht
- Charles J. Burroughs Jr.
- George J. Papaioannou
- Hiroshi Iwai
- Yi-Hua Tang
- Paul D. Dresselhaus
- Volkan Kursun
- Hitoshi Sasaki
- Kuniyuki Kakushima
- Hirotake Yamamori
- P. T. Lai
- Gérard Ghibaudo
- Matroni Koutsoureli
- Frederic Monsieur
- Clark A. Hamilton
- Takamasa Kawanago
- Enrique Miranda
- Kazuo Tsutsui
- James W. Tschanz
- Blaise Jeanneret
- Patrick Pons
- Ilya F. Budovsky
- Joseph R. Kinard
- Shun'ichiro Ohmi
- Boxue Du
- Manfred Klonz
- Thomas E. Lipe
- Vivek De
- Shurong Dong
- Piotr S. Filipski
- Dennis Sylvester
- Montserrat Nafría
- Mark S. Humayun
- D. Zander
- María de la Luz Olvera-Amador
- J. P. Xu
Venues
- Microelectron. Reliab.
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Microelectron. J.
- NEMS
- EMBC
- CoRR
- IEICE Trans. Electron.
- IRPS
- IEEE Trans. Ind. Electron.
- ISCAS
- IBM J. Res. Dev.
- CCE
- IEEE Trans. Biomed. Eng.
- I2MTC
- IEEE SENSORS
- IEICE Electron. Express
- Proc. IEEE
- DRC
- ICTON
- Symmetry
- IEEE J. Solid State Circuits
- OFC
- IAS
- IECON
- ISSCC
- ESSDERC
- VLSI Design
- ICICDT
- IEEE Trans. Circuits Syst. II Express Briefs
- Comput. Phys. Commun.
- ESSCIRC
- Displays
- IET Circuits Devices Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- ICECS
- 3DIC
- J. Sensors
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