ELECTRICAL PROPERTIES
Experts
- Hei Wong
- Ralf Behr
- Samuel P. Benz
- Alain RĂĽfenacht
- Charles J. Burroughs Jr.
- George J. Papaioannou
- Hiroshi Iwai
- Paul D. Dresselhaus
- Kuniyuki Kakushima
- Yi-Hua Tang
- Hitoshi Sasaki
- Hirotake Yamamori
- Volkan Kursun
- GĂ©rard Ghibaudo
- Matroni Koutsoureli
- P. T. Lai
- Blaise Jeanneret
- Takamasa Kawanago
- Boxue Du
- Montserrat NafrĂa
- Ilya F. Budovsky
- Manfred Klonz
- Shun'ichiro Ohmi
- Shurong Dong
- Enrique Miranda
- James W. Tschanz
- Dennis Sylvester
- Vivek De
- Frederic Monsieur
- Joseph R. Kinard
- Clark A. Hamilton
- Kazuo Tsutsui
- Piotr S. Filipski
- Patrick Pons
- Thomas E. Lipe
- David T. Blaauw
- Saibal Mukhopadhyay
- J. P. Xu
- Marco Schubert
Venues
- Microelectron. Reliab.
- Sensors
- IEEE Trans. Instrum. Meas.
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- Microelectron. J.
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- IEEE Trans. Ind. Electron.
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- ICICDT
- IEEE Trans. Circuits Syst. II Express Briefs
- ESSCIRC
- Displays
- IET Circuits Devices Syst.
- Comput. Phys. Commun.
- IEEE Trans. Very Large Scale Integr. Syst.
- ICECS
- 3DIC
- J. Sensors
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