Patrick Pons

Publication Activity (10 Years)

Years Active: 1999-2023
Publications (10 Years): 11

Top Topics

Storage Capacity

Wireless Sensor

Top Venues

Ann. des Télécommunications

Publications

Maylis Lavayssière, Alexandre Lefrançois, Bernard Crabos, Marc Genetier, Maxime Daudy, Sacha Comte, Alan Dufourmentel, Bruno Salsac, Frédéric Sol, Pascal Verdier, Patrick Pons
Toward Improvements in Pressure Measurements for Near Free-Field Blast Experiments. Sensors 23 (12) (2023)
Antony Coustou, Alexandre Lefrançois, Patrick Pons, Yohan Barbarin
Capacitive Effect and Electromagnetic Coupling on Manganin Gauge Limiting the Bandwidth for Pressure Measurements under Shock Conditions. Sensors 23 (14) (2023)
Mathieu Chalnot, Patrick Pons, Hervé Aubert
Frequency Bandwidth of Pressure Sensors Dedicated to Blast Experiments. Sensors 22 (10) (2022)
Kevin Sanchez, Bilel Achour, Antony Coustou, Aurélie Lecestre, Samuel Charlot, Maylis Lavayssière, Alexandre Lefrançois, Hervé Aubert, Patrick Pons
Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring. Sensors 22 (24) (2022)
Julien Philippe, Muriel Ferry, Samuel Charlot, Sandrine Assié, Aurélie Lecestre, Guillaume Libaude, André Ferrand, Patrick Pons, Hervé Aubert
Microelectromechanical Transducer to Monitor High-Doses of Nuclear Irradiation. Sensors 21 (17) (2021)
Dominique Henry, Hervé Aubert, Patrick Pons
Radar Imaging Approach for Zero-Power Millimeter-Wave Wireless Sensors. RFID-TA (2019)
Julien Philippe, Maria Valeria De Paolis, Dominique Henry, Alexandre Rumeau, Antony Coustou, Patrick Pons, Hervé Aubert
In-Situ Wireless Pressure Measurement Using Zero-Power Packaged Microwave Sensors. Sensors 19 (6) (2019)
Nizar Habbachi, Ali Boukabache, Hatem Boussetta, Patrick Pons, Mohamed Adel Kallala, Kamel Besbes
Design and Simulation of a 10 GHz VCO Using an RF MEMS Solenoid Inductor. SSD (2018)
Nizar Habbachi, Ali Boukabache, Hatem Boussetta, Patrick Pons, Mohamed Adel Kallala, Kamel Besbes
Modeling of Microfluidically Tuned Capacitor for RF Applications. SSD (2018)
J. Fourmann, Antony Coustou, Hervé Aubert, Patrick Pons, J. Luc, Alexandre Lefrançois, Maylis Lavayssière, Antoine Osmont
Wireless pressure measurement in air blast using PVDF sensors. IEEE SENSORS (2016)
E. Debourg, J. Philippe, Hervé Aubert, Patrick Pons, Izabela Augustyniak, P. Knapkiewicz, Jan A. Dziuban, M. Matusiak, M. Olszacki
Wireless hydrogen pressure dosimeter for nuclear high dose monitoring. IEEE SENSORS (2016)
Hervé Aubert, Franck Chebila, Mehdi Jatlaoui, Trang T. Thai, Hamida Hallil, Anya Traille, Sofiene Bouaziz, Ayoub Rifaï, Patrick Pons, Philippe Ménini, Manos M. Tentzeris
Wireless sensing and identification based on radar cross section variability measurement of passive electromagnetic sensors. Ann. des Télécommunications 68 (7-8) (2013)
Hervé Aubert, Franck Chebila, Mehdi Jatlaoui, Trang T. Thai, Hamida Hallil, Anya Traille, Sofiene Bouaziz, Ayoub Rifaï, Patrick Pons, Philippe Ménini, Manos M. Tentzeris
Wireless sensing and identification of passive electromagnetic sensors based on millimetre-wave FMCW RADAR. RFID-TA (2012)
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51 (9-11) (2011)
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectron. Reliab. 51 (12) (2011)
Hicham Youssef, André Ferrand, Pierre-François Calmon, Patrick Pons, Robert Plana
Methods to improve reliability of bulge test technique to extract mechanical properties of thin films. Microelectron. Reliab. 50 (9-11) (2010)
Aubin Lecointre, Daniela Dragomirescu, David Dubuc, Katia Grenier, Patrick Pons, Hervé Aubert, A. Muller, Pascal Berthou, Thierry Gayraud, Robert Plana
Miniaturized wireless sensor network CoRR (2010)
Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50 (9-11) (2010)
Usama Zaghloul, George J. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectron. Reliab. 49 (9-11) (2009)
Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48 (8-9) (2008)
A. Belarni, Mohamed Lamhamdi, Patrick Pons, Laurent Boudou, J. Guastavino, Y. Segui, George J. Papaioannou, Robert Plana
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. Microelectron. Reliab. 48 (8-9) (2008)
Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, George J. Papaioannou, Robert Plana
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48 (8-9) (2008)
E. Papandreou, Mohamed Lamhamdi, C. M. Skoulikidou, Patrick Pons, George J. Papaioannou, Robert Plana
Structure dependent charging process in RF MEMS capacitive switches. Microelectron. Reliab. 47 (9-11) (2007)
M. A. Exarchos, E. Papandreou, Patrick Pons, Mohamed Lamhamdi, George J. Papaioannou, Robert Plana
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46 (9-11) (2006)
Mohamed Lamhamdi, J. Guastavino, Laurent Boudou, Y. Segui, Patrick Pons, L. Bouscayrol, Robert Plana
Charging-Effects in RF capacitive switches influence of insulating layers composition. Microelectron. Reliab. 46 (9-11) (2006)
M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45 (9-11) (2005)
Q.-H. Duong, Lionel Buchaillot, Dominique Collard, Petra Schmitt, Xavier Lafontan, Patrick Pons, F. Flourens, Francis Pressecq
Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectron. Reliab. 45 (9-11) (2005)
K. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, Xavier Lafontan, Q.-H. Duong, Lionel Buchaillot, D. Peyrou, Patrick Pons
Biaxial initial stress characterization of bilayer gold RF-switches. Microelectron. Reliab. 45 (9-11) (2005)
David Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, Benoit Ducarouge, Katja Grenier, Patrick Pons, Ali Boukabache, Laurent Bary
Smart MEMS concept for high secure RF and millimeterwave communications. Microelectron. Reliab. 44 (6) (2004)
Zohir Dibi, Ali Boukabache, Patrick Pons
Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor. ICECS (2003)
Petra Schmitt, Francis Pressecq, Xavier Lafontan, Q.-H. Duong, Patrick Pons, Jean Marc Nicot, Coumar Oudéa, Daniel Estève, Jean-Yves Fourniols, Henri Camon
Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. Microelectron. Reliab. 43 (9-11) (2003)
Zohir Dibi, Ali Boukabache, Patrick Pons
Effect of the silicon membrane flatness defect on the piezoresistive pressure sensor response. ICECS (2000)
Philippe Ménini, Gabriel Blasquez, Patrick Pons, C. Douziech, P. Favaro, Philippe Dondon
Optimization of a BiCMOS integrated transducer for self-compensated capacitive pressure sensor. ICECS (1999)
Ali Boukabache, Gabriel Blasquez, Patrick Pons, Zohir Dibi
Study of the thermal drift of the offset voltage of silicon pressure sensor. ICECS (1999)
Philippe Ménini, Gabriel Blasquez, Patrick Pons, Xavier Chauffleur, Philippe Dondon, Christian Zardini
Performances and potentialities of a very simple self-compensated pressure sensor demonstrator. IEEE Trans. Instrum. Meas. 48 (6) (1999)