Fabio Coccetti

Publication Activity (10 Years)

Years Active: 2005-2017
Publications (10 Years): 1

Top Topics

Multicore Processors

Computing Systems

Parallel Computing

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Concurr. Comput. Pract. Exp.

Publications

Mesut Inac, Grzegorz Lupina, Matthias Wietstruck, Marco Lisker, Mirko Fraschke, Andreas Mai, Fabio Coccetti, Mehmet Kaynak
200 mm Wafer level graphene transfer by wafer bonding technique. ESSDERC (2017)
Mihai Alexandru, Thierry Monteil, Petr Lorenz, Fabio Coccetti, Hervé Aubert
Large electromagnetic simulation by hybrid approach on large-scale parallel computing systems. Concurr. Comput. Pract. Exp. 27 (13) (2015)
Nuria Torres Matabosch, Fabio Coccetti, Mehmet Kaynak, Beatrice Espana, Bernd Tillack, Jean-Louis Cazaux
Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process. Microelectron. Reliab. 53 (9-11) (2013)
Mihai Alexandru, Thierry Monteil, Fabio Coccetti, Hervé Aubert, Petr Lorenz
Large electromagnetic problem on large scale parallel computing systems. HPCS (2012)
Nuria Torres Matabosch, Mehmet Kaynak, Fabio Coccetti, Matthias Wietstruck, Bernd Tillack, Jean Louis Cazaux
Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS. Microelectron. Reliab. 52 (9-10) (2012)
Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE Trans. Instrum. Meas. 61 (2) (2012)
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51 (9-11) (2011)
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectron. Reliab. 51 (12) (2011)
Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève
Life expectancy and characterization of capacitive RF MEMS switches. Microelectron. Reliab. 50 (9-11) (2010)
Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50 (9-11) (2010)
Mohamed Matmat, Fabio Coccetti, Antoine Marty, Robert Plana, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève
Capacitive RF MEMS analytical predictive reliability and lifetime characterization. Microelectron. Reliab. 49 (9-11) (2009)
Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49 (9-11) (2009)
Rémi Sharrock, Fadi Khalil, Thierry Monteil, Hervé Aubert, Fabio Coccetti, Patricia Stolf, Laurent Broto, Robert Plana
Deployment and management of large planar reflectarray antennas simulation on grid. CLADE@HPDC (2009)
Usama Zaghloul, George J. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectron. Reliab. 49 (9-11) (2009)
Joo-Young Choi, Jinyu Jason Ruan, Fabio Coccetti, Stepan Lucyszyn
Three-Dimensional RF MEMS Switch for Power Applications. IEEE Trans. Ind. Electron. 56 (4) (2009)
Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48 (8-9) (2008)
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48 (8-9) (2008)
Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, George J. Papaioannou, Robert Plana
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48 (8-9) (2008)
Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectron. Reliab. 47 (9-11) (2007)
M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45 (9-11) (2005)