An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices.
Jinyu Jason RuanNicolas MonnereauDavid TrémouillesNicolas MauranFabio CoccettiNicolas NolhierRobert PlanaPublished in: IEEE Trans. Instrum. Meas. (2012)
Keyphrases
- synthetic data
- high precision
- test data
- experimental study
- similarity measure
- detection method
- pairwise
- optimization algorithm
- high accuracy
- experimental evaluation
- clustering method
- preprocessing
- computational complexity
- data sets
- computationally efficient
- significant improvement
- multiresolution
- error rate
- image processing
- genetic algorithm
- neural network