Nicolas Nolhier

Publication Activity (10 Years)

Years Active: 1999-2021
Publications (10 Years): 5

Top Topics

Evolvable Hardware

Predictive Modeling

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70 (2021)
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectron. Reliab. (2017)
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectron. Reliab. 64 (2016)
Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier
Editorial. Microelectron. Reliab. 55 (9-10) (2015)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectron. Reliab. 55 (11) (2015)
Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet
Reliability of ESD protection devices designed in a 3D technology. Microelectron. Reliab. 54 (9-10) (2014)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectron. Reliab. 53 (9-11) (2013)
Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. Microelectron. Reliab. 53 (2) (2013)
Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE Trans. Instrum. Meas. 61 (2) (2012)
Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49 (9-11) (2009)
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48 (8-9) (2008)
Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectron. Reliab. 47 (9-11) (2007)
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45 (9-11) (2005)
David Trémouilles, Marise Bafleur, Géraldine Bertrand, Nicolas Nolhier, Nicolas Mauran, Lionel Lescouzères
Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency. IEEE J. Solid State Circuits 39 (10) (2004)
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44 (9-11) (2004)
M. Zecri, P. Besse, P. Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier
Determination of the ESD Failure Cause Through its Signature. Microelectron. Reliab. 43 (9-11) (2003)
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. IEEE J. Solid State Circuits 36 (9) (2001)
Christelle Delage, Nicolas Nolhier, Marise Bafleur, Jean-Marie Dorkel, Jo Hamid, Philippe Givelin, Jacques Lin-Kwang
The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation. IEEE J. Solid State Circuits 34 (9) (1999)