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Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas GuitardFabien EsselyDavid TrémouillesMarise BafleurNicolas NolhierPhilippe PerduAndré TouboulVincent PougetDean Lewis
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • robust estimation
  • real time
  • data sets
  • neural network
  • search engine
  • similarity measure
  • structural information
  • graph structure
  • failure prediction