Vincent Pouget

Publication Activity (10 Years)

Years Active: 2000-2020
Publications (10 Years): 9

Top Topics

Comparative Analysis

Calculation Method

Event Detection

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Publications

Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS (2020)
S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, J.-L. Autran, P. Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Effect of Temperature on Single Event Latchup Sensitivity. DTIS (2020)
Gennaro Severino Rodrigues, Ádria Barros de Oliveira, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio
Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection. J. Electron. Test. 35 (3) (2019)
Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio
Performances VS Reliability: how to exploit Approximate Computing for Safety-Critical applications. IOLTS (2018)
Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Vincent Pouget, Alberto Bosio
Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection. LATS (2018)
Fabio Benevenuti, Fabiano Libano, Vincent Pouget, Fernanda Lima Kastensmidt, Paolo Rech
Comparative Analysis of Inference Errors in a Neural Network Implemented in SRAM-Based FPGA Induced by Neutron Irradiation and Fault Injection Methods. SBCCI (2018)
Ygor Q. Aguiar, Frederic Wrobel, J.-L. Autran, P. Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. (2018)
Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectron. Reliab. (2017)
Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné
A calculation method to estimate single event upset cross section. Microelectron. Reliab. (2017)
I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53 (9-11) (2013)
Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. 53 (9-11) (2013)
R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52 (9-10) (2012)
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52 (9-10) (2012)
Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. 51 (9-11) (2011)
C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49 (9-11) (2009)
Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget
Net integrity checking by optical localization techniques. Microelectron. Reliab. 49 (9-11) (2009)
Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS (2008)
Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48 (8-9) (2008)
V. Maingot, Jean Baptiste Ferron, Régis Leveugle, Vincent Pouget, Alexandre Douin
Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results. Microelectron. Reliab. 47 (9-11) (2007)
Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46 (9-11) (2006)
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46 (9-11) (2006)
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45 (9-11) (2005)
Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS (2005)
Vincent Pouget, Dean Lewis, Pascal Fouillat
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE Trans. Instrum. Meas. 53 (4) (2004)
Angie Tetelin, Vincent Pouget, Jean-Luc Lachaud, Claude Pellet
Dynamic behavior of a chemical sensor for humidity level measurement in human breath. IEEE Trans. Instrum. Meas. 53 (4) (2004)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43 (1) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43 (9-11) (2003)
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43 (9-11) (2003)
Dean Lewis, Pascal Fouillat, Vincent Pouget
Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser. LATW (2002)
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41 (9-10) (2001)
Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner
Theoretical Investigation of an Equivalent Laser LET. Microelectron. Reliab. 41 (9-10) (2001)
Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW (2000)