Mathieu Lisart

Publication Activity (10 Years)

Years Active: 2006-2021
Publications (10 Years): 2

Top Topics

Cmos Technology

Integrated Circuit

Top Venues

Microelectron. Reliab.

Publications

Mathieu Dumont, Mathieu Lisart, Philippe Maurine
Modeling and Simulating Electromagnetic Fault Injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (4) (2021)
Mathieu Dumont, Mathieu Lisart, Philippe Maurine
Electromagnetic Fault Injection : How Faults Occur. FDTC (2019)
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. Microelectron. Reliab. 55 (9-10) (2015)
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre
Influence of triple-well technology on laser fault injection and laser sensor efficiency. DFTS (2015)
Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. IRPS (2015)
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. IOLTS (2015)
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. DFTS (2015)
Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart
Electromagnetic analysis and fault injection onto secure circuits. VLSI-SoC (2014)
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC (2014)
Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS (2014)
Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. Microelectron. Reliab. 53 (9-11) (2013)
Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria
Robustness improvement of an SRAM cell against laser-induced fault injection. DFTS (2013)
Karim Tobich, Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, Thomas Ordas
Voltage Spikes on the Substrate to Obtain Timing Faults. DSD (2013)
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52 (9-10) (2012)
François Poucheret, Karim Tobich, Mathieu Lisart, Laurent Chusseau, Bruno Robisson, Philippe Maurine
Local and Direct EM Injection of Power Into CMOS Integrated Circuits. FDTC (2011)
Victor Lomné, Philippe Maurine, Lionel Torres, Thomas Ordas, Mathieu Lisart, Jérome Toublanc
Modeling Time Domain Magnetic Emissions of ICs. PATMOS (2010)
C. Godlewski, Vincent Pouget, Dean Lewis, Mathieu Lisart
Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectron. Reliab. 49 (9-11) (2009)
Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres
Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. PATMOS (2008)
Julien Mercier, Christian Dufaza, Mathieu Lisart
Signoff power methodology for contactless smartcards. ISLPED (2007)
Julien Mercier, Christian Dufaza, Mathieu Lisart
Methodology for Dynamic Power Verification of Contactless Smartcards. PATMOS (2006)