Guillaume Hubert

Publication Activity (10 Years)

Years Active: 2005-2024
Publications (10 Years): 18

Top Topics

Hardware Designs

Reliability Analysis

Transmission Electron Microscopy

Top Venues

Microelectron. Reliab.

Publications

Nasr-Eddine Ouldei Tebina, Luc Salvo, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri
Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification. DATE (2024)
Nasr-Eddine Ouldei Tebina, Aghiles Douadi, Luc Salvo, Vincent Beroulle, Nacer-Eddine Zergainoh, Guillaume Hubert, Elena Ioana Vatajelu, Giorgio Di Natale, Paolo Maistri
Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation. HOST (2024)
Juan Carlos Fabero, Golnaz Korkian, Francisco J. Franco, Guillaume Hubert, Hortensia Mecha, Manon Letiche, Juan Antonio Clemente
SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles. Microprocess. Microsystems 96 (2023)
Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri
Simulation Methodology for Assessing X-Ray Effects on Digital Circuits. DFT (2023)
Nasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri
Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection. IOLTS (2023)
Angeliki Kritikakou, Olivier Sentieys, Guillaume Hubert, Youri Helen, Jean-Francois Coulon, Patrice Deroux-Dauphin
Flodam: Cross-Layer Reliability Analysis Flow for Complex Hardware Designs. DATE (2022)
William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation. IOLTS (2022)
Guillaume Hubert, Sébastien Aubry
Simulation of atmospheric cosmic-rays and their impacts based on pre-calculated databases, physical models and computational methods. J. Comput. Sci. 51 (2021)
William Souza da Cruz, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert
Further Analysis of Laser-induced IR-drop. ATS (2021)
Guillaume Hubert, Sébastien Aubry, Juan Antonio Clemente
Impact of Ground-Level Enhancement (GLE) Solar Events on Soft Error Rate for Avionics. IEEE Trans. Aerosp. Electron. Syst. 56 (5) (2020)
William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert
Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell. SBCCI (2020)
Adriane Cristina Mendes Prado, Mauricio Tizziani Pazianotto, Jose Manuel Quesada Molina, Miguel Antonio Cortes-Giraldo, Guillaume Hubert, Marlon Antonio Pereira, Claudio Antonio Federico
Simulation of Cosmic Radiation Transport Inside Aircraft for Safety Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (5) (2020)
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. VLSI-SoC (2019)
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility. ICECS (2019)
Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Impact of different transistor arrangements on gate variability. Microelectron. Reliab. (2018)
Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors 18 (7) (2018)
Antoine Sauvage, Guillaume Hubert, Jonathan Touboul, Jérôme Ribot
The hemodynamic signal as a first-order low-pass temporal filter: Evidence and implications for neuroimaging studies. NeuroImage 155 (2017)
Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectron. Reliab. (2017)
Guillaume Hubert, Laurent Artola, D. Regis
Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation. Integr. 50 (2015)
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC (2014)
Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Guillaume Hubert
Layout-aware laser fault injection simulation and modeling: From physical level to gate level. DTIS (2014)
Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) (2014)
Laurent Artola, Guillaume Hubert, Massimo Alioto
Comparative soft error evaluation of layout cells in FinFET technology. Microelectron. Reliab. 54 (9-10) (2014)
Guillaume Hubert, Raoul Velazco, Paul Peronnard
A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations. IOLTS (2009)
Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS (2007)
Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS (2006)
Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS (2005)