Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature.
Laurent ArtolaAhmad Al YoussefSamuel DucretFranck PerrierRaphael BuironOlivier GilardJulien MekkiMathieu BoutillierGuillaume HubertChristian PoiveyPublished in: Sensors (2018)