Olivier Gilard

Publication Activity (10 Years)

Years Active: 2006-2018
Publications (10 Years): 2

Top Topics

Integrated Circuit

Top Venues

Microelectron. Reliab.

Publications

Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors 18 (7) (2018)
Jérémy Michaud, G. Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby
Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. Microelectron. Reliab. 55 (9-10) (2015)
Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51 (9-11) (2011)
David Veyrié, Olivier Gilard, Kevin Sanchez, Sébastien Lhuillier, Frédéric Bourcier
New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. Microelectron. Reliab. 50 (4) (2010)
M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectron. Reliab. 48 (8-9) (2008)
A. Gauffier, J.-P. David, Olivier Gilard
Analytical model for multi-junction solar cells prediction in space environment. Microelectron. Reliab. 48 (8-9) (2008)
Mathieu Boutillier, Olivier Gauthier-Lafaye, S. Bonnefont, F. Lozes-Dupuy, F.-J. Vermersch, M. Krakowski, Olivier Gilard
Strong electron irradiation hardness of 852 nm Al-free laser diodes. Microelectron. Reliab. 46 (9-11) (2006)