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Strong electron irradiation hardness of 852 nm Al-free laser diodes.
Mathieu Boutillier
Olivier Gauthier-Lafaye
S. Bonnefont
F. Lozes-Dupuy
F.-J. Vermersch
M. Krakowski
Olivier Gilard
Published in:
Microelectron. Reliab. (2006)
Keyphrases
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electron beam
semiconductor devices
metal oxide
electron beam lithography
worst case
information theoretic
information retrieval
computational complexity
np hard
np hardness
genetic algorithm
decision trees
high level
x ray