ELECTRON BEAM LITHOGRAPHY
Experts
- David Z. Pan
- Bei Yu
- Yao-Wen Chang
- Jhih-Rong Gao
- Kun Yuan
- Shao-Yun Fang
- Omid T. Ghalehbeygi
- Fumihito Arai
- Andrew J. Fleming
- Matthias Markl
- Jungkwun J. K. Kim
- Wengang Wu
- Toly Chen
- Ulrich Rüde
- Carolin Körner
- Regina Ammer
- Soo-Young Lee
- Roderick R. Kunz
- Ivan A. Vartanyants
- Vadim Tynchenko
- Thomas Bazin
- Hafizur Rahaman
- Shinya Sakuma
- Jun Taniguchi
- G. U. L. Nagy
- Charles T. Black
- Christian Daul
- Kurt Ronse
- Eric Hendrickx
- Menghan Xiong
- C. Karen Liu
- Geert Vandenberghe
- Dominic Windisch
- Zhimin Zhang
- Axel Garcia-Vega
- Takuma Nakano
- Edward A. Rietman
- Wolfgang Fichtner
- Masakuni Sugita
Venues
- IBM J. Res. Dev.
- NEMS
- CoRR
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Int. J. Autom. Technol.
- OFC
- Comput. Phys. Commun.
- ICIP
- DAC
- Micromachines
- ICTON
- IEEE Access
- ISSCC
- ISPD
- IEEE Trans. Instrum. Meas.
- ISCAS
- CICC
- Proc. IEEE
- ICCAD
- ASP-DAC
- IEEE Trans. Ind. Electron.
- IGARSS
- ICAC
- BCICTS
- ISQED
- Symmetry
- ACC
- ICECS
- Int. J. Comput. Assist. Radiol. Surg.
- VLSI Design
- ISBI
- Int. J. Comput. Eng. Sci.
- ICASSP
- Remote. Sens.
- J. Robotics Mechatronics
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend