ELECTRON BEAM LITHOGRAPHY
Experts
- David Z. Pan
- Bei Yu
- Yao-Wen Chang
- Jhih-Rong Gao
- Shao-Yun Fang
- Kun Yuan
- Andrew J. Fleming
- Fumihito Arai
- Omid T. Ghalehbeygi
- Toly Chen
- Wengang Wu
- Jungkwun J. K. Kim
- Matthias Markl
- Roderick R. Kunz
- Soo-Young Lee
- Regina Ammer
- Carolin Körner
- Ulrich Rüde
- Qingwang Meng
- Masato Suzuki
- Makoto Ikeda
- Dongxu Ren
- Sergey A. Bobkov
- Lars Liebmann
- V. Havranek
- Yuelin Wang
- Xinghua Sang
- Ben S. Routley
- Evangeline F. Y. Young
- Yi Yin
- Stephen R. Duncan
- Dong Du
- Haibo Yu
- Ioannis Exarchos
- Brian H. Do
- J. Grifka
- T. Renkawitz
- Yang Wang
- Tomokazu Takahashi
Venues
- IBM J. Res. Dev.
- CoRR
- NEMS
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Int. J. Autom. Technol.
- OFC
- ICTON
- Micromachines
- Comput. Phys. Commun.
- ICIP
- DAC
- ISSCC
- IEEE Access
- CICC
- ISCAS
- Proc. IEEE
- ICCAD
- ASP-DAC
- ISPD
- IEEE Trans. Instrum. Meas.
- Symmetry
- ACC
- Int. J. Comput. Assist. Radiol. Surg.
- ICECS
- VLSI Design
- ISBI
- Int. J. Comput. Eng. Sci.
- IEEE Trans. Ind. Electron.
- IGARSS
- ISQED
- ICAC
- BCICTS
- ICMENS
- ECOC
- ISVLSI
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