ELECTRON BEAM LITHOGRAPHY
Experts
- David Z. Pan
- Bei Yu
- Jhih-Rong Gao
- Yao-Wen Chang
- Shao-Yun Fang
- Kun Yuan
- Omid T. Ghalehbeygi
- Fumihito Arai
- Andrew J. Fleming
- Matthias Markl
- Toly Chen
- Regina Ammer
- Carolin Körner
- Roderick R. Kunz
- Ulrich Rüde
- Wengang Wu
- Soo-Young Lee
- Jungkwun J. K. Kim
- Allison M. Okamura
- Cor Meenderinck
- Yuelin Wang
- Baohua Chang
- Menghan Xiong
- Rimon Ikeno
- Philippe Jansen
- Reid G. Simmons
- Hafizur Rahaman
- B. Craiovan
- Alexandr Ignatenko
- Tetsuya Iizuka
- Romain D. Arnal
- J. Grifka
- Chao Li
- S. Santangelo
- Wei-Yu Chen
- Mieke Goethals
- Mihir Parikh
- I. Bányász
- Eric Hendrickx
Venues
- IBM J. Res. Dev.
- CoRR
- NEMS
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Int. J. Autom. Technol.
- OFC
- ICIP
- ICTON
- Micromachines
- Comput. Phys. Commun.
- DAC
- ISSCC
- IEEE Access
- ICCAD
- ISCAS
- CICC
- ISPD
- Proc. IEEE
- IEEE Trans. Instrum. Meas.
- ASP-DAC
- ICECS
- ICAC
- IEEE Trans. Ind. Electron.
- ISQED
- Symmetry
- ACC
- IGARSS
- VLSI Design
- BCICTS
- Int. J. Comput. Eng. Sci.
- Int. J. Comput. Assist. Radiol. Surg.
- ISBI
- ACM Trans. Design Autom. Electr. Syst.
- J. Robotics Mechatronics
- ECOC
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