METAL OXIDE
Experts
- Vivek De
- Andreas K. Maier
- James W. Tschanz
- Krishnan Ravichandran
- Roman Genov
- Wim Dehaene
- Stephen T. Kim
- Alison J. Burdett
- Lei Wang
- Robert Bogdan Staszewski
- Pedram Mohseni
- David T. Blaauw
- Frede Blaabjerg
- Alex Q. Huang
- Kiyoshi Kato
- Seiichi Miyazaki
- Philip K. T. Mok
- Ke-Horng Chen
- Mitsuru Takenaka
- Dennis Sylvester
- Anantha P. Chandrakasan
- Shunpei Yamazaki
- Maysam Ghovanloo
- Ali Khiat
- Toby P. Breckon
- Muhammad M. Khellah
- Shinichi Takagi
- Pak Kwong Chan
- Masahiro Fujita
- Hoi Lee
- Hei Wong
- Liang Shi
- Chun Jason Xue
- Themistoklis Prodromakis
- Qiang Li
- Joachim Hornegger
- Nassir Navab
- Rinkle Jain
- Po-Hung Chen
Venues
- CoRR
- Sensors
- IEEE J. Solid State Circuits
- Microelectron. Reliab.
- IEEE Trans. Ind. Electron.
- IEEE Access
- ISCAS
- IECON
- ISSCC
- OFC
- Microelectron. J.
- IEICE Trans. Electron.
- IEEE Trans. Instrum. Meas.
- ESSCIRC
- IEEE Trans. Circuits Syst. II Express Briefs
- CICC
- IRPS
- ICECS
- IEICE Electron. Express
- J. Comput. Chem.
- NEMS
- MWSCAS
- IEEE Trans. Circuits Syst. I Regul. Pap.
- Int. J. Circuit Theory Appl.
- IEEE Trans. Medical Imaging
- IEEE SENSORS
- A-SSCC
- IEEE Trans. Very Large Scale Integr. Syst.
- IBM J. Res. Dev.
- ESSDERC
- Symmetry
- Proc. IEEE
- EMBC
- Comput. Phys. Commun.
- ASICON
- ECOC
- VLSI Circuits
- ISBI
- IEEE Trans. Biomed. Circuits Syst.
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