Laurent Béchou

Publication Activity (10 Years)

Years Active: 2002-2018
Publications (10 Years): 2

Top Topics

Assembly Process

Computer Integrated Manufacturing

Top Venues

Microelectron. Reliab.

Publications

M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Microelectron. Reliab. (2018)
Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. (2017)
Jérémy Michaud, G. Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby
Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. Microelectron. Reliab. 55 (9-10) (2015)
Pamela Del Vecchio, Arnaud Curutchet, Yannick Deshayes, M. Bettiati, F. Laruelle, Nathalie Labat, Laurent Béchou
Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes. Microelectron. Reliab. 55 (9-10) (2015)
Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage. Microelectron. Reliab. 55 (9-10) (2015)
A. Royon, K. Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, Yannick Deshayes
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy. Microelectron. Reliab. 53 (9-11) (2013)
E. Suhir, Laurent Béchou
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing. Microelectron. Reliab. 53 (9-11) (2013)
Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51 (9-11) (2011)
Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectron. Reliab. 50 (9-11) (2010)
Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Béchou
Strain estimation in III-V materials by analysis of the degree of polarization of luminescence. Microelectron. Reliab. 50 (4) (2010)
M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectron. Reliab. 48 (8-9) (2008)
Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, P. H. Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectron. Reliab. 48 (8-9) (2008)
Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou
Use of signal processing imaging for the study of a 3D package in harsh environment. Microelectron. Reliab. 46 (9-11) (2006)
S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectron. Reliab. 45 (9-11) (2005)
Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44 (9-11) (2004)
Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43 (9-11) (2003)
Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43 (7) (2003)
Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52 (1) (2003)
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43 (7) (2003)
Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectron. Reliab. 42 (9-11) (2002)
B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, B. Parmentier
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectron. Reliab. 42 (7) (2002)