Dominique Laffitte

Publication Activity (10 Years)

Years Active: 2002-2005
Publications (10 Years): 0

Publications

S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectron. Reliab. 45 (9-11) (2005)
Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44 (9-11) (2004)
Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43 (9-11) (2003)
J. Van de Casteele, Dominique Laffitte, G. Gelly, C. Starck, M. Bettiati
High reliability level demonstrated on 980nm laser diode. Microelectron. Reliab. 43 (9-11) (2003)
C. Gautier, J. Périnet, E. Nissou, Dominique Laffitte
New method of qualification applied to optical amplifier with electronics. Microelectron. Reliab. 43 (9-11) (2003)
Jean-Luc Goudard, X. Boddaert, J. Périnet, Dominique Laffitte
Reliability of optoelectronics components: towards new qualification practices. Microelectron. Reliab. 43 (9-11) (2003)
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43 (7) (2003)
Jean-Luc Goudard, P. Berthier, X. Boddaert, Dominique Laffitte, J. Périnet
New qualification approach for optoelectronic components. Microelectron. Reliab. 42 (9-11) (2002)