Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
S. HuygheLaurent BéchouNicolas ZerounianYannick DeshayesFrédéric AnielA. DenolleDominique LaffitteJean-Luc GoudardYves DantoPublished in: Microelectron. Reliab. (2005)