Yves Danto

Publication Activity (10 Years)

Years Active: 1997-2007
Publications (10 Years): 0

Publications

W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto
Torsion test applied for reballing and solder paste volume evaluation. Microelectron. Reliab. 47 (9-11) (2007)
Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont
Dynamic void formation in a DD-copper-structure with different metallization geometry. Microelectron. Reliab. 47 (2-3) (2007)
Corinne Bestory, François Marc, Hervé Levi, Yves Danto
Multi-level Modeling of Hot Carrier Injection for Reliability. FDL (2006)
W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto
Improved physical understanding of intermittent failure in continuous monitoring method. Microelectron. Reliab. 46 (9-11) (2006)
S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectron. Reliab. 45 (9-11) (2005)
A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak
Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectron. Reliab. 45 (9-11) (2005)
Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto
How to study delamination in plastic encapsulated devices. Microelectron. Reliab. 44 (9-11) (2004)
Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44 (9-11) (2004)
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44 (9-11) (2004)
Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto
Moisture diffusion in BCB resins used for MEMS packaging. Microelectron. Reliab. 43 (9-11) (2003)
Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43 (9-11) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43 (1) (2003)
François Marc, B. Mongellaz, Yves Danto
Reliability simulation of electronic circuits with VHDL-AMS. FDL (2003)
Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectron. Reliab. 43 (7) (2003)
B. Mongellaz, François Marc, Yves Danto
Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectron. Reliab. 43 (9-11) (2003)
Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52 (1) (2003)
David Dalleau, Kirsten Weide-Zaage, Yves Danto
Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures. Microelectron. Reliab. 43 (9-11) (2003)
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43 (9-11) (2003)
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43 (7) (2003)
Geneviève Duchamp, Yves Ousten, Yves Danto
Evaluation of a micropackaging analysis technique by highfrequency microwaves. Microelectron. Reliab. 42 (9-11) (2002)
B. Mongellaz, François Marc, N. Milet-Lewis, Yves Danto
Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. Microelectron. Reliab. 42 (9-11) (2002)
Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectron. Reliab. 42 (9-11) (2002)
B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, B. Parmentier
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectron. Reliab. 42 (7) (2002)
A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron. Reliab. 42 (6) (2002)
Ahmed Fakhfakh, Hervé Levi, N. Milet-Lewis, Yves Danto
Behavioral Modeling of Analogue and Mixed Integrated Systems with VHDL-AMS for RF Applications. SBCCI (2002)
Thomas Zimmer, Patrice Kadionik, Yves Danto
A World-Wide-Web based instrumentation pool real testing in a virtual world. MSE (1997)