Frédéric Verdier

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 2

Top Topics

Model Driven Architecture

Software Product Line

Top Venues

Microelectron. Reliab.

MODELSWARD (Revised Selected Papers)

Publications

Frédéric Verdier, Abdelhak-Djamel Seriai, Raoul Taffo Tiam
Combining Model-Driven Architecture and Software Product Line Engineering: Reuse of Platform-Specific Assets. MODELSWARD (Revised Selected Papers) (2018)
Frédéric Verdier, Abdelhak-Djamel Seriai, Raoul Taffo Tiam
Reusing Platform-specific Models in Model-Driven Architecture for Software Product Lines. MODELSWARD (2018)
Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier
A methodological approach for predictive reliability: Practical case studies. Microelectron. Reliab. 52 (12) (2012)
Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests. Microelectron. Reliab. 44 (9-11) (2004)
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44 (9-11) (2004)
Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectron. Reliab. 43 (9-11) (2003)
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectron. Reliab. 43 (7) (2003)
Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, André Touboul, P. Huguet, R. Bonnet, G. Pataut
Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectron. Reliab. 41 (9-10) (2001)