François Marc

Publication Activity (10 Years)

Years Active: 2000-2022
Publications (10 Years): 12

Top Topics

Modelling Language

Digital Circuits

Top Venues

Microelectron. Reliab.

Publications

Lucas Réveil, Chhandak Mukherjee, Cristell Maneux, Marina Deng, François Marc, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu, Arnaud Poittevin, Ian O'Connor, Oskar Baumgartner, David Pirker
Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors. VLSI-SoC (2022)
Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng, Marine Couret, François Marc, Cristell Maneux, Thomas Zimmer
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. BCICTS (2021)
Arnaud Poittevin, Chhandak Mukherjee, Ian O'Connor, Cristell Maneux, Guilhem Larrieu, Marina Deng, Sébastien Le Beux, François Marc, Aurélie Lecestre, Cédric Marchand, Abhishek Kumar
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. VLSI-SoC (Selected Papers) (2020)
Chhandak Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Cédric Marchand, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. VLSI-SOC (2020)
C. Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu
3D logic cells design and results based on Vertical NWFET technology including tied compact model. CoRR (2020)
Marine Couret, Gerhard Fischer, Iria Garcia-Lopez, Magali De Matos, François Marc, Cristell Maneux
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current. ESSDERC (2019)
Jorgue Daniel Aguirre Morales, François Marc, A. Bensoussan, A. Durier
Simulation and modelling of long term reliability of digital circuits implemented in FPGA. Microelectron. Reliab. (2018)
Julien Coutet, François Marc, Flavien Dozolme, Romain Guétard, Aurélien Janvresse, Pierre Lebossé, Antonin Pastre, Jean-Claude Clement
Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories. Microelectron. Reliab. (2018)
Christopher H. Bennett, Jean-Etienne Lorival, François Marc, Theo Cabaret, Bruno Jousselme, Vincent Derycke, Jacques-Olivier Klein, Cristell Maneux
Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor. IEEE Trans. Multi Scale Comput. Syst. 4 (4) (2018)
Nathalie Labat, François Marc, Hélène Frémont, Marise Bafleur
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis. Microelectron. Reliab. (2017)
Mohammad Naouss, François Marc
FPGA LUT delay degradation due to HCI: Experiment and simulation results. Microelectron. Reliab. 64 (2016)
Mohammad Naouss, François Marc
Modelling delay degradation due to NBTI in FPGA Look-up tables. FPL (2016)
Mohammad Naouss, François Marc
Design and implementation of a low cost test bench to assess the reliability of FPGA. Microelectron. Reliab. 55 (9-10) (2015)
Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier
Editorial. Microelectron. Reliab. 55 (9-10) (2015)
Nathalie Labat, François Marc
Editorial. Microelectron. Reliab. 53 (9-11) (2013)
Olivier Héron, Clement Bertolini, Chiara Sandionigi, Nicolas Ventroux, François Marc
On the Simulation of HCI-Induced Variations of IC Timings at High Level. J. Electron. Test. 29 (2) (2013)
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
Impact of Power Consumption and Temperature on Processor Lifetime Reliability. J. Low Power Electron. 8 (1) (2012)
Clement Bertolini, Olivier Héron, Nicolas Ventroux, François Marc
Relation between HCI-induced performance degradation and applications in a RISC processor. IOLTS (2012)
Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux
Advancements on reliability-aware analog circuit design. ESSCIRC (2012)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51 (9-11) (2011)
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51 (9-11) (2011)
Nathalie Labat, François Marc
Editorial. Microelectron. Reliab. 51 (9-11) (2011)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
High Level Power and Energy Exploration Using ArchC. SBAC-PAD (2010)
Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer
Thermal aging model of InP/InGaAs/InP DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Corinne Bestory, François Marc, S. Duzellier, Hervé Levi
Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. Microelectron. Reliab. 49 (9-11) (2009)
Corinne Bestory, François Marc, Hervé Levi
Statistical analysis during the reliability simulation. Microelectron. Reliab. 47 (9-11) (2007)
Corinne Bestory, François Marc, Hervé Levi, Yves Danto
Multi-level Modeling of Hot Carrier Injection for Reliability. FDL (2006)
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. Microelectron. Reliab. 44 (9-11) (2004)
François Marc, B. Mongellaz, Yves Danto
Reliability simulation of electronic circuits with VHDL-AMS. FDL (2003)
B. Mongellaz, François Marc, Yves Danto
Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. Microelectron. Reliab. 43 (9-11) (2003)
B. Mongellaz, François Marc, N. Milet-Lewis, Yves Danto
Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. Microelectron. Reliab. 42 (9-11) (2002)
Marc Lecouve, Pierre Jarry, Eric Kerherve, Nicolas Boutheiller, François Marc
Genetic algorithm optimisation for evanescent mode waveguide filter design. ISCAS (2000)