Brice Grandchamp

Publication Activity (10 Years)

Years Active: 2004-2012
Publications (10 Years): 0

Top Topics

Reliability Assessment

Top Venues

Publications

Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux
Advancements on reliability-aware analog circuit design. ESSCIRC (2012)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51 (9-11) (2011)
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51 (9-11) (2011)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer
Thermal aging model of InP/InGaAs/InP DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. Microelectron. Reliab. 44 (9-11) (2004)