Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.
G. A. KonéBrice GrandchampC. HainautFrançois MarcCristell ManeuxNathalie LabatThomas ZimmerVirginie NodjiadjimMuriel RietJean GodinPublished in: Microelectron. Reliab. (2011)