Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.

G. A. Koné Brice Grandchamp C. Hainaut François Marc Cristell Maneux Nathalie Labat Thomas Zimmer Virginie Nodjiadjim Muriel Riet Jean Godin

Published in: Microelectron. Reliab. (2011)

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