Cristell Maneux

Publication Activity (10 Years)

Years Active: 2003-2024
Publications (10 Years): 25

Top Topics

Millimeter Wave

Reliability Analysis

Top Venues

Microelectron. Reliab.

Publications

Ian O'Connor, Sara Mannaa, Alberto Bosio, Bastien Deveautour, Damien Deleruyelle, Tetiana Obukhova, Cédric Marchand, Jens Trommer, Çigdem Çakirlar, Bruno Neckel Wesling, Thomas Mikolajick, Oskar Baumgartner, Mischa Thesberg, David Pirker, Christoph Lenz, Zlatan Stanojevic, Markus Karner, Guilhem Larrieu, Sylvain Pelloquin, Konstantinous Moustakas, Jonas Müller, Giovanni Ansaloni, Alireza Amirshahi, David Atienza, Jean-Luc Rouas, Leila Ben Letaifa, Georgeta Bordeall, Charles Brazier, Chhandak Mukherjee, Marina Deng, Yifan Wang, Marc François, Houssem Rezgui, Reveil Lucas, Cristell Maneux
FVLLMONTI: The 3D Neural Network Compute Cube $(N^{2}C^{2})$ Concept for Efficient Transformer Architectures Towards Speech-to-Speech Translation. DATE (2024)
Yifan Wang, Chhandak Mukherjee, Houssem Rezgui, Marina Deng, Cristell Maneux, Sara Mannaa, Ian O'Connor, Jonas Müller, Sylvain Pelloquin, Guilhem Larrieu
Electrothermal modeling of junctionless vertical Si nanowire transistors for 3D logic circuit design. ESSDERC (2023)
C. Mukherjee, Djeber Guendouz, Marina Deng, H. Bertin, Antoine Bobin, Nicolas Vaissiere, Christophe Caillaud, Akshay M. Arabhavi, Rimjhim Chaudhary, Olivier Ostinelli, Colombo R. Bolognesi, Patrick Mounaix, Cristell Maneux
SPICE Modeling in Verilog-A for Photo-Response in UTC-Photodiodes Targeting Beyond-5G Circuit Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (9) (2023)
Nil Davy, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Marina Deng, Chhandak Mukherjee, Bertrand Ardouin, Cristell Maneux
InP DHBT Analytical Modeling: Toward THz Transistors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (11) (2023)
Arnaud Poittevin, Ian O'Connor, Cédric Marchand, Alberto Bosio, Cristell Maneux, Chhandak Mukherjee, Guilhem Larrieu, Abhishek Kumar
A Logic Cell Design and routing Methodology Specific to VNWFET. NEWCAS (2022)
Nil Davy, Marina Deng, Virginie Nodjiadjim, Chhandak Mukherjee, Muriel Riet, Colin Mismer, Jérémie Renaudier, Cristell Maneux
InP DHBT test structure optimization towards 110 GHz characterization. ESSDERC (2022)
Lucas Réveil, Chhandak Mukherjee, Cristell Maneux, Marina Deng, François Marc, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu, Arnaud Poittevin, Ian O'Connor, Oskar Baumgartner, David Pirker
Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors. VLSI-SoC (2022)
Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng, Marine Couret, François Marc, Cristell Maneux, Thomas Zimmer
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. BCICTS (2021)
Nil Davy, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Marina Deng, Chhandak Mukherjee, Jérémie Renaudier, Cristell Maneux
0.4-μm InP/InGaAs DHBT with a 380-GHz ${f_{T}}$, > 600-GHz $f_{\max}$ and BVCE0 > 4.5 V. BCICTS (2021)
Marina Deng, Chhandak Mukherjee, Nil Davy, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Jérémie Renaudier, Magali De Matos, Cristell Maneux
InP DHBT Characterization up to 500 GHz and Compact Model Validation Towards THz Circuit Design. BCICTS (2021)
C. Mukherjee, Marine Couret, Cristell Maneux, Didier Céli
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. ESSDERC (2021)
Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions. ATS (2021)
Arnaud Poittevin, Chhandak Mukherjee, Ian O'Connor, Cristell Maneux, Guilhem Larrieu, Marina Deng, Sébastien Le Beux, François Marc, Aurélie Lecestre, Cédric Marchand, Abhishek Kumar
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. VLSI-SoC (Selected Papers) (2020)
Chhandak Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Cédric Marchand, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. VLSI-SOC (2020)
C. Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu
3D logic cells design and results based on Vertical NWFET technology including tied compact model. CoRR (2020)
Marine Couret, Gerhard Fischer, Iria Garcia-Lopez, Magali De Matos, François Marc, Cristell Maneux
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current. ESSDERC (2019)
Mathieu Jaoul, Didier Céli, Cristell Maneux, Thomas Zimmer
Measurement based accurate definition of the SOA edges for SiGe HBTs. BCICTS (2019)
Chhandak Mukherjee, Patrick Mounaix, Cristell Maneux, Michele Natrella, James Seddon, Chris Graham, Cyril C. Renaud
First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design. ESSDERC (2019)
Christopher H. Bennett, Jean-Etienne Lorival, François Marc, Theo Cabaret, Bruno Jousselme, Vincent Derycke, Jacques-Olivier Klein, Cristell Maneux
Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor. IEEE Trans. Multi Scale Comput. Syst. 4 (4) (2018)
Chhandak Mukherjee, Cristell Maneux, Julien Pezard, Guilhem Larrieu
1/f Noise in 3D vertical gate-all-around junction-less silicon nanowire transistors. ESSDERC (2017)
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Bock, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. Proc. IEEE 105 (6) (2017)
Mathieu Jaoul, Didier Céli, Cristell Maneux, Michael Schröter, Andreas Pawlak
Avalanche compact model featuring SiGe HBTs characteristics up to BVcbo. ESSDERC (2017)
C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Bock, Klaus Aufinger, Cristell Maneux
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. Microelectron. Reliab. 73 (2017)
C. Mukherjee, Thomas Jacquet, Thomas Zimmer, Cristell Maneux, Anjan Chakravorty, Josef Bock, Klaus Aufinger
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations. ESSDERC (2016)
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer, W. Wei, Henri Happy
Physics-based electrical compact model for monolayer Graphene FETs. ESSDERC (2016)
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectron. Reliab. 55 (9-10) (2015)
Sébastien Fregonese, Jorgue Daniel Aguirre Morales, Magali De Matos, Cristell Maneux, Thomas Zimmer
Graphene FET evaluation for RF and mmWave circuit applications. ISCAS (2015)
C. Mukherjee, Jorgue Daniel Aguirre Morales, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, W. Wei
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs. ESSDERC (2015)
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors. ESSDERC (2015)
Sébastien Fregonese, Rosario D'Esposito, Magali De Matos, Andreas Kohler, Cristell Maneux, Thomas Zimmer
Substrate-coupling effect in BiCMOS technology for millimeter wave applications. NEWCAS (2015)
C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, David Mele
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. ESSDERC (2014)
Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux
Advancements on reliability-aware analog circuit design. ESSCIRC (2012)
Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. ESSDERC (2012)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51 (9-11) (2011)
Si-Yu Liao, Jean-Marie Retrouvey, Guillaume Agnus, Weisheng Zhao, Cristell Maneux, Sébastien Fregonese, Thomas Zimmer, Djaafar Chabi, Arianna Filoramo, Vincent Derycke, Christian Gamrat, Jacques-Olivier Klein
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices. IEEE Trans. Circuits Syst. I Regul. Pap. (9) (2011)
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51 (9-11) (2011)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Sébastien Fregonese, Cristell Maneux, Thomas Zimmer
From nanoscale technology scenarios to compact device models for ambipolar devices. ICECS (2010)
Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer
Thermal aging model of InP/InGaAs/InP DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Ian O'Connor, Junchen Liu, Frédéric Gaffiot, Fabien Prégaldiny, Christophe Lallement, Cristell Maneux, Johnny Goguet, Sébastien Fregonese, Thomas Zimmer, Lorena Anghel, Trong-Trinh Dang, Régis Leveugle
CNTFET Modeling and Reconfigurable Logic-Circuit Design. IEEE Trans. Circuits Syst. I Regul. Pap. (11) (2007)
Nathalie Labat, Nathalie Malbert, Cristell Maneux, André Touboul
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors. Microelectron. Reliab. 44 (9-11) (2004)
Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. Microelectron. Reliab. 44 (9-11) (2004)
Mohamed Belhaj, Cristell Maneux, Nathalie Labat, André Touboul, Philippe Bove
High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects. Microelectron. Reliab. 43 (9-11) (2003)
J. C. Martin, Cristell Maneux, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectron. Reliab. 43 (9-11) (2003)