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Thomas Jacquet
ORCID
Publication Activity (10 Years)
Years Active: 2015-2017
Publications (10 Years): 2
Top Topics
Multi Tiered
Reliability Analysis
Thin Film
Service Oriented Architecture
Top Venues
Microelectron. Reliab.
ESSDERC
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Publications
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C. Mukherjee
,
Thomas Jacquet
,
Anjan Chakravorty
,
Thomas Zimmer
,
Josef Bock
,
Klaus Aufinger
,
Cristell Maneux
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.
Microelectron. Reliab.
73 (2017)
C. Mukherjee
,
Thomas Jacquet
,
Thomas Zimmer
,
Cristell Maneux
,
Anjan Chakravorty
,
Josef Bock
,
Klaus Aufinger
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.
ESSDERC
(2016)
Thomas Jacquet
,
Grazia Sasso
,
Anjan Chakravorty
,
Niccolò Rinaldi
,
Klaus Aufinger
,
Thomas Zimmer
,
Vincenzo d'Alessandro
,
Cristell Maneux
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab.
55 (9-10) (2015)