Thomas Zimmer

Publication Activity (10 Years)

Years Active: 1997-2023
Publications (10 Years): 13

Top Topics

European Project

Millimeter Wave

Reliability Analysis

Top Venues

Int. J. Online Eng.

Microelectron. Reliab.

Publications

Thomas Zimmer, Sébastien Fregonese, Anjan Chakravorty
Electro-Thermal Investigation of SiGe HBTs: A Review. BCICTS (2023)
Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng, Marine Couret, François Marc, Cristell Maneux, Thomas Zimmer
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. BCICTS (2021)
Soumya Ranjan Panda, Sébastien Fregonese, Anjan Chakravorty, Thomas Zimmer
TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range. BCICTS (2019)
Mathieu Jaoul, Didier Céli, Cristell Maneux, Thomas Zimmer
Measurement based accurate definition of the SOA edges for SiGe HBTs. BCICTS (2019)
Bishwadeep Saha, Sébastien Frégonese, Soumya Ranjan Panda, Anjan Chakravorty, Didier Céli, Thomas Zimmer
Collector-substrate modeling of SiGe HBTs up to THz range. BCICTS (2019)
Philipp Hillger, Ritesh Jain, Janusz Grzyb, Wolfgang Forster, Bernd Heinemann, Gaetan MacGrogan, Patrick Mounaix, Thomas Zimmer, Ullrich R. Pfeiffer
A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging. IEEE J. Solid State Circuits 53 (12) (2018)
Philipp Hillger, Ritesh Jain, Janusz Grzyb, Laven Mavarani, Bernd Heinemann, Gaetan MacGrogan, Patrick Mounaix, Thomas Zimmer, Ullrich R. Pfeiffer
A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS. ISSCC (2018)
D. Fadi, W. Wei, Emiliano Pallecchi, M. Anderson, J. Stake, Marina Deng, Sébastien Fregonese, Thomas Zimmer, Henri Happy
2D RF Electronics: from devices to circuits - challenges and applications. DRC (2018)
J. Bazzi, H. Kassem, Arnaud Curutchet, Franck Pourchon, N. Derrier, Didier Céli, Thomas Zimmer
A two-step de-embedding method valid up to 110 GHz. ICM (2017)
Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Bock, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. Proc. IEEE 105 (6) (2017)
C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Bock, Klaus Aufinger, Cristell Maneux
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. Microelectron. Reliab. 73 (2017)
C. Mukherjee, Thomas Jacquet, Thomas Zimmer, Cristell Maneux, Anjan Chakravorty, Josef Bock, Klaus Aufinger
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations. ESSDERC (2016)
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer, W. Wei, Henri Happy
Physics-based electrical compact model for monolayer Graphene FETs. ESSDERC (2016)
Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectron. Reliab. 55 (9-10) (2015)
Sébastien Fregonese, Jorgue Daniel Aguirre Morales, Magali De Matos, Cristell Maneux, Thomas Zimmer
Graphene FET evaluation for RF and mmWave circuit applications. ISCAS (2015)
Thomas Zimmer
From the eScience Project Chair. Int. J. Interact. Mob. Technol. 9 (2) (2015)
Thomas Zimmer, Michel Billaud, Emmanouil D. Fylladitakis, Petros J. Axaopoulos
HeliosLab: A remote photovoltaic laboratory. exp.at (2015)
C. Mukherjee, Jorgue Daniel Aguirre Morales, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, W. Wei
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs. ESSDERC (2015)
Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors. ESSDERC (2015)
Sébastien Fregonese, Rosario D'Esposito, Magali De Matos, Andreas Kohler, Cristell Maneux, Thomas Zimmer
Substrate-coupling effect in BiCMOS technology for millimeter wave applications. NEWCAS (2015)
Thomas Zimmer, Michel Billaud, M. Pic, Didier Geoffroy
Remote Lab Experiments in Electronics for Use and Reuse. Int. J. Interact. Mob. Technol. 9 (2) (2015)
Thrasyvoulos Tsiatsos, Stella Douka, Apostolos Mavridis, Stergios Tegos, Ahmed Naddami, Thomas Zimmer, Didier Geoffroy
Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries. Int. J. Online Eng. 10 (5) (2014)
C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, David Mele
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. ESSDERC (2014)
Thomas Zimmer
TEMPUS Project eSience. Int. J. Online Eng. 10 (5) (2014)
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
Impact of Power Consumption and Temperature on Processor Lifetime Reliability. J. Low Power Electron. 8 (1) (2012)
Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. ESSDERC (2012)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51 (9-11) (2011)
Si-Yu Liao, Jean-Marie Retrouvey, Guillaume Agnus, Weisheng Zhao, Cristell Maneux, Sébastien Fregonese, Thomas Zimmer, Djaafar Chabi, Arianna Filoramo, Vincent Derycke, Christian Gamrat, Jacques-Olivier Klein
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices. IEEE Trans. Circuits Syst. I Regul. Pap. (9) (2011)
Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51 (9-11) (2011)
G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Sébastien Fregonese, Cristell Maneux, Thomas Zimmer
From nanoscale technology scenarios to compact device models for ambipolar devices. ICECS (2010)
Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc
High Level Power and Energy Exploration Using ArchC. SBAC-PAD (2010)
Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer
Thermal aging model of InP/InGaAs/InP DHBT. Microelectron. Reliab. 50 (9-11) (2010)
Noëlle Lewis, Michel Billaud, Didier Geoffroy, Philippe Cazenave, Thomas Zimmer
A Distance Measurement Platform Dedicated to Electrical Engineering. IEEE Trans. Learn. Technol. 2 (4) (2009)
Ian O'Connor, Junchen Liu, Frédéric Gaffiot, Fabien Prégaldiny, Christophe Lallement, Cristell Maneux, Johnny Goguet, Sébastien Fregonese, Thomas Zimmer, Lorena Anghel, Trong-Trinh Dang, Régis Leveugle
CNTFET Modeling and Reconfigurable Logic-Circuit Design. IEEE Trans. Circuits Syst. I Regul. Pap. (11) (2007)
Thomas Zimmer, Michel Billaud, Didier Geoffroy
Integration of remote lab exercises into standard course packages. Int. J. Online Eng. 3 (3) (2007)
Didier Geoffroy, Thomas Zimmer, Michel Billaud
A remote laboratory for electrical engineering education. Int. J. Online Eng. 2 (3) (2006)
Yvan Maidon, Thomas Zimmer, André Ivanov
An Analog Circuit Fault Characterization Methodology. J. Electron. Test. 21 (2) (2005)
Hassène Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese
Representation of the SiGe HBT's thermal impedance by linear and recursive networks. Microelectron. Reliab. 44 (6) (2004)
Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. Microelectron. Reliab. 44 (9-11) (2004)
Thomas Zimmer, N. Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat
Hierarchical Analogue Design and Behavioural Modelling. MSE (1999)
Thomas Zimmer, Patrice Kadionik, Yves Danto
A World-Wide-Web based instrumentation pool real testing in a virtual world. MSE (1997)